Samsung Electronics Co., Ltd.

Kang-Young Cho

Hee-Il Hong

Sang-Seok Kang

Jae-Hoon Joo

Byung-heon Kwak

Chang-hag Oh

Provided is a semiconductor device capable of effectively testing whether memory cells and a memory cell array are defective. The semiconductor device may include a memory cell array having a plurality of memory cells and an external test pad connected to an internal test pad. A test voltage may be applied to the plurality of word lines connected to the plurality of memory cells via the external test pad and the internal test pad in a test mode, wherein the test voltage disables the plurality of word lines.

Semiconductor device capable of being tested after packaging

Provided is a DRAM having reduced current consumption and a communication terminal including the same. The DRAM includes a plurality of memory banks capable of being independently supplied with power, and a DPD controller for selectively causing some of the plurality of memory banks to enter a DPD mode.

Growing community of inventors

Suwon-si, South Korea

Kang-Young Cho