Shimadzu Corporation

Kan Nakamura

Yasuo Tsukuda

Osamu Ando

Atsuhiro Iida

A near infrared analyzer has, arranged on a base, a halogen tungsten lamp as light source, an optical stop for light from the source, an optical system for converging a flux of light for measuring and directing it to a measuring section and a system including an integrating sphere at which a sample is set. A spectrometer part has its entrance slit placed on the bottom surface of the integrating sphere, and includes a diffraction grating for diffraction and dispersion of incident light flux from the entrance slit, an arrayed detector and a reflective mirror for reflecting the diffracted light from the diffraction grating so as to be dispersed and focused on the surface of the detector. Signals from the detector can be sequentially retrieved for electronically scanning wavelengths without mechanically oscillating or rotating the grating. This makes it possible to maintain high accuracy in wavelengths over a long period of time. As the speed of measurement is increased, measurements can be repeated and obtained data integrated for reducing noise and improving accuracy of measurement.

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Kyoto, Japan

Kan Nakamura