Western Digital Technologies, Inc.

Kameron K Jung

Choo-Bhin Ong

Cheng Fatt Yee

Jinghuan Chen

Suleyman Attila Yolar

John Minh Hon Quan

Jame Show Leiong Hii

Kian Wai Ng

In various embodiments, systems and methods to detect signal irregularity caused by defects in the read/write head element are disclosed. In some embodiments, an exemplary system comprises a memory and a processor. The processor is coupled to the memory and is configured to implement a filter module and a detector module. The filter module is configured to generate a test waveform based on data read from a medium by a storage device head to be tested. The detector module is configured to generate a signal quality value based on a property of at least a portion of the test waveform, compare the signal quality value to an event threshold, and generate an event indicator based on the comparison, the event indicator indicating possible instability of the storage device head.

Systems and methods for storage device read/write head malfunction detection

A disk drive is disclosed comprising a first disk surface comprising multiple zones, each comprising multiple tracks, a first head actuated radially over the first disk surface to write data to and read data from the first disk surface, and control circuitry coupled to the head. The control circuitry sets the first head to a first fly height over a first zone, writes a data pattern on a first track in the first zone, reads the data pattern to determine a first value of a first metric, writes a first frequency pattern on the first track, determines an initial amplitude of the first frequency pattern, writes a second frequency pattern over the first frequency pattern, determines a first value of a second metric for the first frequency pattern, and determines a first fly height value for the first zone by utilizing the first values of the first and second metrics.

Disk drive with dynamic head fly height back-off

A method of operating a disk drive is disclosed, the disk drive comprising a head actuated over a disk surface, and a first non-volatile semiconductor memory (NVSM). Calibrated parameters are stored in the first NVSM, wherein the calibrated parameters for accessing the disk surface. Prior to altering the disk drive, the calibrated parameters are uploaded from the disk drive to a host. After altering the disk drive, the calibrated parameters are downloaded from the host to the disk drive and the calibrated parameters are stored in a second NVSM.

Modifying a disk drive while preserving calibrated parameters stored in a non-volatile semiconductor memory

Growing community of inventors

Yorba Linda, CA, United States of America

Kameron K Jung