Taiwan Semiconductor Manufacturing Comp. Ltd.

Kal-Wen Tan

Chewn-Pu Jou

Fu-Lung Hsueh

Tzu-Jin Yeh

Sally Liu

In accordance with an embodiment, a method for substrate noise analysis comprises using a first processor based system, creating and simulating a circuit schematic comprising a multi-terminal model of a transistor, and thereafter, creating a layout based on properties represented in the circuit schematic and simulation results of the simulating. The multi-terminal model comprises a source terminal, a gate terminal, a drain terminal, a body terminal, and a guard-ring terminal.

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Taipei, Taiwan

Kal-Wen Tan