Renesas Electronics Corporation

Renesas Electric Corporation

Kakeru Kimura

Yoshimi Iso

Yuji Shimizu

Masashi Nishimoto

Tadashi Matsushima

Masakazu Okamura

Koji Hirano

Shoichi Hamada

Shinji Takeda

Masahito Kajiwara

Takuro Ichikawa

A semiconductor device includes: a sensor detecting electric capacitance of a touch key group comprising a plurality of touch keys arranged in a matrix; and a control device configured to perform character recognition based on a change in the electric capacitance of the plurality of touch keys detected by the sensor and on a sampling pattern that is time-series data of a loci.

Semiconductor device, character recognition device, and character recognition methods

An ultrasonic receiver receives ultrasonic waves reflected at a plurality of portions of the body of a person to be measured, and thus the person to be measured needs to input the approximate height of himself/herself. An electrostatic capacitance sensor includes a transmission electrode and a reception electrode. The electrostatic capacitance sensor measures a mutual capacitance between the transmission electrode and the reception electrode by a mutual capacitance method. A variable frequency pulse generator generates a pulse supplied to the transmission electrode. A control apparatus allows the variable frequency pulse generator to sweep the frequency of the pulse and allows the electrostatic capacitance sensor to measure the mutual capacitance to identify a frequency at which the measured mutual capacitance is minimized. The control apparatus obtains the height of a person to be measured on the basis of the identified frequency.

Height measuring apparatus, health care device, and rotary gate

The present invention provides a data processing system which can increase resolution and which has excellent tracking with respect to the switching of a conversion range and is small in conversion error. The data processing system, which obtains an A/D conversion result after an n (where n: positive integer)-bit extension made to the resolution of an A/D converter, divides the input range of the A/D converter by m (2&#x2266;m), determines to which divided range the A/D conversion result by the A/D converter belongs with respect to an analog signal to be measured, amplifies an amp offset which defines the range of the determined divided range as a voltage range for the input range of the A/D converter by applying the amp offset to a programmable gain amplifier, converts the amplified signal by the A/D converter, and adds a corresponding digital offset to a result of execution of a lower side bit extension to the conversion result and a division thereof by actually measured gain of the programmable gain amplifier, whereby an A/D conversion result with a bit precision being n-bit extended is obtained.

Data processing system

In AD conversion of a voltage, data continuity is ensured between the results of conversion after amplification and of direct conversion without amplification. In AD conversion operation, an analog signal output from a DA converter circuit is directly converted by an AD converter circuit, and the analog signal is converted after amplification with an expected gain of 2'. Based on resultant data, a gain of an amplifier circuit and an offset thereof are calculated. An analog signal to be enhanced in bit precision is amplified by the amplifier circuit and converted by the AD converter circuit, the offset is subtracted from the resultant conversion, and the result is multiplied by a ratio of the expected gain to the calculated gain to cancel gain error. Based on data with gain error canceled, acquisition of bit-extended conversion result data is performed to ensure continuity between data having different degrees of bit precision.

Data processing device and data processing system

In AD conversion of a voltage, data continuity is ensured between the results of conversion after amplification and of direct conversion without amplification. In AD conversion operation, an analog signal output from a DA converter circuit is directly converted by an AD converter circuit, and the analog signal is converted after amplification with an expected gain of 2. Based on resultant data, a gain of an amplifier circuit and an offset thereof are calculated. An analog signal to be enhanced in bit precision is amplified by the amplifier circuit and converted by the AD converter circuit, the offset is subtracted from the resultant conversion, and the result is multiplied by a ratio of the expected gain to the calculated gain to cancel gain error. Based on data with gain error canceled, acquisition of bit-extended conversion result data is performed to ensure continuity between data having different degrees of bit precision.

In AD conversion of a voltage under measurement, data continuity is ensured between the result of conversion after amplification by using an amplifier circuit and the result of direct conversion without using the amplifier circuit. In AD conversion operation using a DA converter circuit, an amplifier circuit, and an AD converter circuit under the direction of a control circuit, an analog signal output from the DA converter circuit is directly converted by the AD converter circuit, and also the analog signal is converted therein after amplified by the amplifier circuit with an expected gain of 2('n' represents a positive integer). Based on resultant data thus obtained, a gain of the amplifier circuit and an offset thereof are calculated. An analog signal under measurement to be enhanced in bit precision is subjected to amplification by the amplifier circuit and conversion by the AD converter circuit, the offset calculated as mentioned above is subtracted from the result of the conversion, and the result of the subtraction thus performed is multiplied by a ratio of the expected gain to the gain calculated as mentioned above so as to cancel a gain error. Then, based on data with the gain error canceled, acquisition of bit-extended conversion result data is performed to ensure continuity between data having different degrees of bit precision.

Growing community of inventors

Tokyo, Japan

Kakeru Kimura