Growing community of inventors

San Jose, CA, United States of America

Kai-Yuan Ting

Average Co-Inventor Count = 4.52

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 16

Kai-Yuan TingSandeep Kumar Goel (18 patents)Kai-Yuan TingYun-Han Lee (9 patents)Kai-Yuan TingAshok Mehta (9 patents)Kai-Yuan TingStanley John (8 patents)Kai-Yuan TingTze-Chiang Huang (6 patents)Kai-Yuan TingMei Hsu Wong (6 patents)Kai-Yuan TingChao-Yang Yeh (3 patents)Kai-Yuan TingHsin-Cheng Chen (3 patents)Kai-Yuan TingShereef Shehata (3 patents)Kai-Yuan TingCharlie Zhou (1 patent)Kai-Yuan TingKai-Yuan Ting (18 patents)Sandeep Kumar GoelSandeep Kumar Goel (96 patents)Yun-Han LeeYun-Han Lee (91 patents)Ashok MehtaAshok Mehta (21 patents)Stanley JohnStanley John (15 patents)Tze-Chiang HuangTze-Chiang Huang (39 patents)Mei Hsu WongMei Hsu Wong (16 patents)Chao-Yang YehChao-Yang Yeh (22 patents)Hsin-Cheng ChenHsin-Cheng Chen (18 patents)Shereef ShehataShereef Shehata (13 patents)Charlie ZhouCharlie Zhou (3 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Taiwan Semiconductor Manufacturing Comp. Ltd. (18 from 40,635 patents)


18 patents:

1. 12204825 - Function safety and fault management modeling at electrical system level (ESL)

2. 11354465 - Function safety and fault management modeling at electrical system level (ESL)

3. 11231767 - Dynamic frequency scaling

4. 11163351 - Power estimation

5. 10867089 - Electrical system level (ESL) battery discharge simulation

6. 10867098 - System and method for ESL modeling of machine learning

7. 10776538 - Function safety and fault management modeling at electrical system level (ESL)

8. 10719648 - System and method for system-level parameter estimation

9. 10345883 - Power estimation

10. 10101796 - Processor power estimation

11. 10061374 - Dynamic frequency scaling

12. 9646128 - System and method for validating stacked dies by comparing connections

13. 9625971 - System and method of adaptive voltage frequency scaling

14. 9612277 - System and method for functional verification of multi-die 3D ICs

15. 9047432 - System and method for validating stacked dies by comparing connections

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12/4/2025
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