Advanced Micro Devices Corporation

Kah Shan Chen

Hock Chuan Koh

Justin Valentino Ajmer

Gim Leong Tan

Yeow Kwang Loh

A jig assembly for use in calibrating a thermocouple sensor includes a conductive member, a holder, and a fastener. The conductive member has a recess configured to receive a test wire and a test surface configured for thermal contact with the thermocouple sensor. The holder is adapted to receive the conductive member. The fastener is coupleable to the holder, wherein the holder and fastener form a recess configured to receive the test wire.

System and method for calibrating a thermocouple sensor

A socket cover is mounted onto a socket for monitoring that an IC (integrated circuit) package is properly placed onto the socket with proper orientation and proper alignment. The socket cover includes a platform that is attached on top of the socket, and the platform has an opening for exposing pins of the socket when the platform is attached onto the top of the socket. The IC package is placed within the opening of the platform and onto the pins of the socket for testing of the IC package. A signal generator is disposed on a first side of the opening of the platform for emitting a signal across the opening toward a second side of the opening. A signal detector is disposed on the second side of the opening of the platform, and the signal detector is aligned with the signal generator such that the signal detector detects the signal emitted by the signal generator when the signal is not blocked. The signal detector detects the signal emitted by the signal generator when the IC package that is placed with proper orientation and proper alignment within the opening of the platform does not block the signal. Alternatively, the signal detector does not detect the signal emitted by the signal generator when the IC package that is placed with improper orientation or improper alignment within the opening of the platform does block the signal.

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Singapore, Singapore

Kah Shan Chen