Samsung Electronics Co., Ltd.

Ka Ram Lee

Dae Seo Park

Oh Seok Kwon

Min Su Kim

Jong Woo Kim

Jong Tae Kim

Won Soo Ji

Ju Hyun Kang

A semiconductor device may include a master latch that stores an input data signal, using a local power supply voltage and a clock signal, and outputs the input data signal to a first output signal; a slave latch that stores the first output signal, using a global power supply voltage, the clock signal and a retention signal, and outputs a second output signal; a first logic gate that receives input of one signal and another signal of the retention signal, the clock signal and the reset signal, and outputs a first control signal generated by performing a first logical operation; and a second logic gate that receives input of the rest of the retention signal, the clock signal and the reset signal, and the first control signal, and performs a second logical operation to at least one of the master latch and the slave latch.

Semiconductor device including retention reset flip-flop

Manufacturing a light source module may include mounting light emitting devices on substrates on an upper surface of a carrier, mounting optical devices to cover the light emitting devices, and inspecting the light emitting devices and the optical devices based on selectively capturing images thereof. Images may be captured based on controlling a light source module scanner assembly on the carrier. The substrates may extend in a first direction and may be spaced apart in a second direction. Controlling the light source module scanner assembly may include moving the light source module scanner assembly along a selected direction to position the light source module scanner assembly on at least one of the light emitting devices and the optical devices. The direction may be selected based on the quantity of substrates and the quantity of light emitting devices and optical devices on each of the substrates.

Methods of manufacturing light source module

A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.

Method of inspecting a light source module for defects, method of manufacturing a light source module, and apparatus for inspecting a light source module

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Suwon-si, South Korea

Ka Ram Lee