Netzsch-gerätebau Gmbh

Jürgen Tschöpel

Juergen Blumm

Thomas Denner

Thilo Hilpert

Martin Brunner

Stefan Lauterbach

Andreas Strobel

Michael Gebhardt

Georg Storch

Marco Zier

Georg Neumann

André Lindemann

Marc-Antoine Thermitus

Reinhard Gschwendtner

Robert Campbell

Andreas Hartinger

Matthias Schödel

Jürgen Blumm

Patrick Biermann

Markus Hilmer

Kai Dinges

Stephan Lauer

Claas Luhmann

Wiebold Wurpts

Leonhard Faulhammer

Michel Bellmann

A material analysis device for analysing a material sample. The material analysis device is equipped with a—generally temperature-controllable—sample chamber and a sample holder, which, supported by at least one pillar, protrudes into the sample chamber, and a loading shaft, to one end of which force is applied by an exciter, and the other end of which bears a connecting member, with which it transmits force to the sample in a defined manner and loads same thereby.

Material analysis device with quick attachment

A system for measuring the thermal diffusivity of a material includes a housing having an upper portion and a lower portion, a plate holding the material in a fixed position between the upper portion and lower portion of the housing, and a source at the lower portion of the housing projecting heat onto the material along a first axis that is perpendicular to the plate. A sensor at the lower portion of the housing is movable in relation to the plate and senses the heat radiating through the material along a second axis that is perpendicular to the plate and offset from the first axis. A controller receives data from the sensor and calculates the thermal diffusivity of the material.

3D diffusivity

Growing community of inventors

Arzberg, Germany

Jürgen Tschöpel