Prüftechnik Dieter Busch Gmbh

Fluke Corporation

Pruftechnik Dieter Busch Ag

Jürgen Peters

Bernd Fuchsloch

A probe device for a rotating head has at least one support arm that is mounted so as to rotate around an axis of rotation, at least one probe that is joined to the support arm, and at least one spring element that can be supported on the rotating head and engages at the support arm and that is provided for exerting a force on the support arm, which, as a result of this force, experiences a torque with respect to the axis of rotation. The support arm has at least one mount, which is concentric with the axis of rotation, for the spring element, which, when arranged on the mount, is bent at least in part around the axis of rotation. As a consequence, centrifugal forces that act on the spring element when the rotating head is in operation have no influence on the tension of the spring element.

Probe device with spiral spring, rotating head and testing apparatus

Disclosed herein is a differential probe, a testing device having at least one such differential probe, and a method for producing the same. The differential probe has a first half-probe and a second half-probe, at least one conductor loop pair having a conductor loop of each half-probe being shaped mirror-inverted relative to each other and, in respect of a mirror-inverted arrangement thereof on respective sides of a mirror plane. The conductor loops are oriented parallel to the mirror plane, are arranged offset relative to each other in an offset direction, also parallel to the mirror plane, wherein the conductor loops overlap in part in the direction normal to the mirror plane.

Differential probe, testing device and production method

A probe device for a rotating head of a rotary system comprises at least one support arm that is mounted so as to be rotatable about an axis of rotation, at least one probe that is connected to the support arm, and at least one cable guide for guiding a probe cable. The cable guide comprises a first end portion that extends along the support arm, from the probe to the axis of rotation, and a second end portion that originates essentially at the axis of rotation.

Growing community of inventors

Pliening, Germany

Jürgen Peters