Leica Microsystems Cms Gmbh

Leica Microsystems Heidelberg Gmbh

Jörg Bewersdorf

Hilmar Gugel

Johann Engelhardt

Juergen Hoffmann

The invention relates to a confocal 4&#x3c0; microscopy method which is characterized by coherently illuminating a sample from two sides by one objective each with illumination light which has at least one illumination wavelength whereby a stationary illumination wave having a main illumination maximum and secondary illumination maxima is produced by interference of the illumination light in the sample. The detection light emitted by the sample has at least one detection wavelength and is detected through the two objectives. The detection light is made to interfere, thereby producing in the sample a detection pattern having a main detection maximum, secondary detection maxima and detection minima in such a manner that the secondary illumination maxima and the detection minima overlap at least partially.

Confocal 4-pi microscope and method for confocal 4-pi microscopy

The present invention concerns a double confocal scanning microscope () having an illuminating beam path () of at least one light source (), and a detected beam path () of at least one detector (), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components () arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis () and/or at least one surface () in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.

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Göttingen, Germany

Jörg Bewersdorf