Oracle International Corporation

Jyotika Singh

James Michael Frei

Ryan Travis Caldwell

Stephen Andrew Muller

Kenneth F Hatch

Connie K Szeto

A method for characterization of fixture utilizes a mirror symmetric THRU structure and either a HALF-THRU with a LOAD shunted to ground or a THRU with a LOAD shunted to ground located at the mirror reference plane. The method extracts the short, open, and thru measurements from the THRU structure due to the mirror symmetry. The HALF-THRU with a LOAD or the THRU with a LOAD shunted to ground located at the mirror reference plane provides the independent measurement to fully characterize the fixture. The resultant impedance or scattering parameter HALF-THRU model may be used in de-embedding a Device-Under-Test, a calibration routine, or computational simulations. The parameters of a HALF-THRU model may be stored in a memory storage circuit affixed to the associated HALF-THRU fixture. Some embodiments may include at least one memory storage circuit that attaches to the HALF-THRU fixture body affixed to an interposing matable connector.

De-embedding and calibration of mirror symmetric reciprocal networks

A finite impulse response (FIR) extractor includes at least one controller. The controller injects specified FIR tap values into a first captured waveform that results from transmitting a raw waveform through a transmitter circuit including a FIR filter having pre and post cursor tap values set to zero to create an expected waveform, and injects the specified FIR tap values into the raw waveform to create an ideal waveform. The controller further projects the expected and ideal waveforms onto a second captured waveform that results from transmitting the ideal waveform through the transmitter circuit with the pre and post cursor tap values set to the specified FIR tap values to create a compensated waveform, and extracts FIR tap values from the compensated waveform.

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San Jose, CA, United States of America

Jyotika Singh