1. Infineon Technologies Ag (18 from 14,705 patents)

2. Other (1 from 832,680 patents)

1. 7307895 - Self test for the phase angle of the data read clock signal DQS

2. 7117403 - Method and device for generating digital signal patterns

3. 7117404 - Test circuit for testing a synchronous memory circuit

4. 7062690 - System for testing fast synchronous digital circuits, particularly semiconductor memory chips

5. 7043653 - Method and apparatus for synchronous signal transmission between at least two logic or memory components

6. 6957373 - Address generator for generating addresses for testing a circuit

7. 6954871 - Method of matching different signal propagation times between a controller and at least two processing units, and a computer system

8. 6910161 - Device and method for reducing the number of addresses of faulty memory cells

9. 6871306 - Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested

10. 6865707 - Test data generator

11. 6862702 - Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices

12. 6853206 - Method and probe card configuration for testing a plurality of integrated circuits in parallel

13. 6839397 - Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits

14. 6762611 - Test configuration and test method for testing a plurality of integrated circuits in parallel

15. 6744272 - Test circuit