Teknologian Tutkimuskeskus Vtt

Oulun Yliopisto

Timegate Instruments Oy

Glaxo Group Limited

Teknologian Tutkimuskeskus Vtt Oy

Valtion Teknillinen Tutkimuskeskus

Metso Automation Oy

Valmet Automation Oy

Metso Paper Automation Oy

Jussi Tenhunen

Juha Kostamovaara

Markku M&auml;ntyl&auml;

Lauri Kurki

Markku K&auml;ns&auml;koski

Markku Mäntylä

Jarkko Antila

Jouko Malinen

Ralf Marbach

Pekka Suopajärvi

Markku Känsäkoski

Ilkka Alasaarela

Timo Hyv&auml;rinen

Jan Nissinen

Rami Aikio

Janne Paaso

Ilkka Nissinen

Markku KÄNSÄKOSKI

Markku MÄNTYLÄ

An apparatus for measuring time-resolved optical spectrum includes a light source, a sensor for collecting, forming, manipulating and measuring the intensity of the optical radiation, and a controller coupled to the light source and sensor. The sensor includes at least one optical delay element to provide a time delay to a first portion of the optical radiation. The sensor arrangement further includes an optical spectral disperser to split the delayed first portion and the second portion of the optical radiation into dispersed radiation having a plurality of wavelengths, and a sensor element configured to receive each wavelength of the dispersed radiation on a different spatial region, and measure the light intensity associated with each wavelength of the dispersed radiation. The controller collects the light intensity associated with each wavelength of the dispersed radiation measured by the sensor element to form a time-resolved optical spectrum.

Apparatus for measuring Raman spectrum and method thereof

Optical multi-channel measurement unit for a process measurement includes first ends for receiving optical radiation from the optical radiation source, and second ends for outputting the optical radiation for illuminating the at least one object. Optical detectors receive optical radiation from at least one measurement channel via at least one optical filter and convert an intensity of the optical radiation to an electrical signal. A movement mechanism causes, for filtering the wavelengths of the optical radiation propagating between detectors and the optical measurement channels through the optical filters, at least one of the following: movement inside at least one optical filter and movement between the filters and the detectors.

Optical multi-channel measurement unit, optical multi-channel detector unit and a measurement method for measuring a property of an object

An apparatus, includes an illuminating light source and illuminating optics arranged to illuminate a sample region with illuminating light pulses, light gathering optics to gather Raman scattered light pulses from the sample region, a spectral disperser and a detector array for measuring the spectral intensity distribution of Raman scattered light pulses obtained from the sample region and an auxiliary detector for providing an indicator signal indicative of elastic scattering coefficient of the sample region. The apparatus is arranged to form a first output spectrum from the spectral intensity distribution of a first group of Raman scattered light pulses. The pulses of the first group of Raman scattered light pulses are obtained from the sample region when the indicator signal indicates that an object is located in the sample region.

Method and apparatus for measuring inelastic scattering

A device and a method for optical measurement of a target, wherein the target is irradiated with radiation beam () and a measurement beam () is received from the target and detected. Commonly used absorbance, reflectance and fluorescence measurements do not provide adequate information in e.g. measuring small contents of sulphur compounds. The present solution provides a new Raman spectrometer which is suitable for mass applications. A target is activated with pulses of a laser diode (). The Raman signatures are measured and integrated successively with a point detector (). A Fabry-Perot interferometer () on the measurement path is successively controlled into corresponding pass bands. While high spectral resolution or range is not required it is possible to use small-sized and low cost components.

Device and method for optical measurement of a target

An apparatus comprises a semiconductor single-photon avalanche detector, and a counter. The detector performs detections of photons of optical radiation caused by an optical excitation pulse to the object. The counter measures timing of each detection made in the detector with respect to the excitation pulse causing the detected photons, and performs at least one of the following: forming a number of Raman detections, forming a number of fluorescence detections. Forming the number of the Raman detections is performed by eliminating an estimate of a number of fluorescence photons in the measurement. Forming the number of the fluorescence detections is performed by eliminating an estimate of a number of Raman photons in the measurement. The estimates are formed in a predetermined manner from the number and timing of the detections.

Measurement of raman radiation

An apparatus and method using the apparatus for measuring target samples, particularly pharmaceutical products using Raman radiation. The sample is located in an aperture in a wall structure with a reflective surface on one or both of the sides of the wall structure facing respectively the excitation radiation transmitter or the Raman radiation detector. Preferably two reflective surfaces each in hemispherical shape and facing each other in a spherical arrangement are provided, with the wall structure across the diameter of the sphere.

Apparatus for testing samples using raman radiation

An apparatus comprises a plurality of detecting elements and a summer. Each detecting element receives and detects different bands of spectrum of Raman radiation formed in response to at least one optical excitation pulse directed to the object. The detecting elements and/or the summer receives a command to enable registration of detections in the detecting elements and a command to disable the registration during or after the Raman radiation. The summer registers separately the detections of the Raman radiation in at least two detecting elements for presenting data on the object on the basis of the detections.

An entrance slit of the spectrometer is illuminated with optical radiation. An optical component images the entrance slit to an optical modulator by the optical radiation and disperses the optical radiation into a spectrum. The spectrum is modulated by the optical modulator The optical component composes spectral non-dispersive measurement radiation of the spectrum and images the entrance slit included in the measurement radiation to an exit slit which may be the same one as the exit slit or a different one. Measurement radiation is detected from the entrance slit with a detector, which converts the measurement radiation into an electrical measurement signal.

Spectrometer and method for measuring optical spectrum

The invention relates to a method and an apparatus for measuring a coating from paper or board. The measurement is carried out by one detector at different times or by two detectors simultaneously. IR radiation directed at the coating and radiation emerging from the coating are chopped synchronously in blocks. A wavelength band sensitive and insensitive to the absorption are bandpass filtered and measured in both the MIR and NIR region. The absorption strength is measured in a digital signal processing block by comparing the radiation sensitive to absorption to the radiation insensitive to absorption, and the amount of each coating component is determined in the digital signal processing block on the basis of the absorption strength.

Method and apparatus for measuring coating

The invention relates to a method and an apparatus for measuring the properties of paper from a moving paper web in a paper machine. An infrared beam is directed to the paper web. The infrared beam, passed through or reflected from the paper web, is split into wavelength components with a spectrograph, and signals of the different wavelength components are measured, and the properties of paper are determined on the basis of the signals.

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Oulu, Finland

Jussi Tenhunen