Matsushita Electric Industrial Co., Ltd.

Junji Kondou

Yuji Igata

Masahiro Maki

Satoshi Hasako

A display device comprises an inspection circuit for inspecting a data reception related circuit to generate inspection information, an inspection result image generation circuit for generating image data indicating the inspection information, a display switching circuit for superimposing inspection result image data on test video data, and a display unit for displaying the test video data superimposing the inspection result image data. As a result, it is possible to carry out inspection after assembly of the display device without disassembling the display device. This in turn makes it possible to carry out a test in a simple manner on the data reception related circuit inside the display device without changing noise environment inside the display device.

Display device, receiver, and test apparatus

Impedance values of a common mode choke coil, an impedance element disposed anterior to the common mode choke coil and an impedance element disposed posterior to the common mode choke coil are determined in such a manner that a common mode current flowing into the common mode choke coil does not exceed a value of rated current. Excessive common mode current is prevented from flowing into the common mode choke coil, and saturation and damage of the common mode choke coil is prevented.

Growing community of inventors

Tagawa-Gun, Japan

Junji Kondou