Semiconductor Components Industries, LLC

JunHo Lee

Kinam Song

Jinkyu Choi

Wonhi Oh

Seunghyun Hong

Hyunsoo Bae

Sangmin Park

Seungjae Lee

A circuit and method for detecting a failure of a switching power device is disclosed. The circuit and method utilize a Kelvin connection of a four-terminal configuration of the switching power device to sense a resistance of at least one wire-bond. The resistance corresponds to a defect or defects in the at least one wire-bond and so it can be used to detect a failure before damage occurs. A threshold used for detecting the failure can be adjusted to accommodate variations in the switching power device and/or the application in which it is being used. Additionally, the failure detection is carried out at a period after the switching power device is turned ON to prevent switching transients from affecting the detection.

Circuit and method to detect defects in a power switching device

A circuit for controlling a gate driver includes a delay circuit, a first logic circuit, and a second logic circuit. The delay circuit receives a first turn-off signal and produces a second turn-off signal by delaying an assertion of the first turn-off signal by a freewheeling duration. The first logic circuit receives the first and second turn-off signals and produces a smart turn-off signal by asserting the smart turn-off signal when the first turn-off signal is asserted and the second turn-off signal is not asserted. The second logic circuit receives a restart signal and the smart turn-off signal and produces a smart reset signal by asserting the smart reset signal when the restart signal and the smart turn-off signal are de-asserted, and de-asserting the smart reset signal when one or more of the restart signal and the smart turn-off signal are asserted.

Smart turn-off for gate driver circuit

A circuit for controlling a power converter includes a pulse generator generating a first pulse signal and a second pulse signal in response to an input signal, the first pulse signal being asserted at a given time interval or thereafter after the input signal has been de-asserted, a level-shift circuit shifting a level of the first pulse signal to generate a first shifted signal and to shift a level of the second pulse signal to generate a second shifted signal, a logic circuit controlling a first-side switching device in response to the first and second shifted signals, and an output node outputting an output signal. The first-side switching device is coupled to a second side-switching device at the output node.

Control of pulse generator in driving control device

In a general aspect, an apparatus can include a low-side drive circuit configured to control a low-side device of a power semiconductor device pair and a high-side drive circuit configured to control a high-side device of the power semiconductor device pair. The high-side drive circuit can include an input circuit configured to receive an input signal and produce, based on the input signal, a first control signal, from which a latch set signal is produced to turn on the high-side device, and a second control signal, from which a latch reset signal is produced to turn off the high-side device. The high-side drive circuit can further include an overlap-prevention circuit configured to prevent timing overlap between the second control signal and a voltage-recovery period of the high-voltage circuit, where the voltage-recovery period occurs after turning off the high-side device of the power semiconductor device pair.

Growing community of inventors

Bucheon, South Korea

JunHo Lee