Moreh Corp.

Lg Display Co., Ltd.

Seoul National University

Jungho Park

Gangwon Jo

Jaejin Lee

Sooyoun Kim

Jinpyo Kim

Heehoon Kim

A method for generating an intermediate representation for a program for execution on an accelerator is executed by one or more processors, and includes hooking information on instruction from a program, determining whether the hooked information on instruction is associated with an accelerator, if it is determined that the information on instruction is associated with the accelerator, generating a first intermediate representation for the instruction using information on input and output data and information on instruction included in the instruction, and generating a second intermediate representation for the program for one or more accelerators using the first intermediate representation, and the first intermediate representation and the second intermediate representation include a plurality of data nodes, one or more operation nodes, and a plurality of edges indicating an input and output relationship between the plurality of data nodes and the one or more operation nodes.

Method and system for generating intermediate representation for program for execution on accelerator

Provided is a fault tolerance method which is performed by one or more processors, and which includes receiving an application execute command, executing a main process of an application in response to the execute command, receiving, by a split execution module, information on a plurality of devices associated with the execution of the application from an orchestrator, executing, by the split execution module, a sub-process for each of the plurality of devices using the information on the plurality of devices, and performing, by the split execution module, fault tolerance associated with the execution of the application using an idle device, if a failure occurs in at least some of the plurality of devices.

Method and system for fault tolerance

An inspecting apparatus for a glass substrate detects blurs of a green color filter layer, a blue color filter layer, a column spacer layer, a pixel layer of a thin film transistor, or the like, which are generally hardly inspected. The inspecting apparatus for a glass substrate includes: a first illumination unit supplying reflective light to a surface of the substrate to inspect whether the surface of the substrate is defective or not; a second illumination unit supplying transmissive light from a rear side of the substrate to inspect whether the interior of the substrate is defective or not; a latticed rear plate provided on a rear surface of the substrate; and a driving interferometer system generating a phase difference of light by driving such that a driving guide is moved along the rear plate or the rear plate itself is moved.

Inspecting apparatus for glass substrate

Growing community of inventors

Seoul, South Korea

Jungho Park