Samsung Electronics Co., Ltd.

Jungho Do

Sanghoon Baek

Taejoong Song

Jonghoon Jung

Seungyoung Lee

Jisu Yu

Minjae Jeong

Jaewoo Seo

Bonghyun Lee

Hyeongyu You

Jae-Woo Seo

An integrated circuit may include a first function cell and a second function cell each corresponding to a first circuit, wherein the first function cell may include a first pattern extending in a first direction along a first grid in a first layer and a second pattern extending in the first direction along a second grid in a second layer, the first grid may have a first pitch greater than a second pitch of the second grid in a second direction crossing the first direction, and the second function cell may include a layout of the first function cell and have a length greater than a length of the first function cell by the first pitch in the second direction.

Integrated circuit including standard cells and method of designing the same

An integrated circuit device is provided. The integrated circuit device includes: a substrate with a first active area and a second active area spaced apart from each other in a first horizontal direction; a plurality of normal cells arranged on a first surface of the substrate; a power wiring structure arranged on a second surface of the substrate; and a power gating cell arranged on the first surface of the substrate. The power gating cell includes: a sleep control transistor arranged in the first active area; and a through via penetrating the second active area of the substrate. The power gating cell is configured to provide a virtual power voltage to the plurality of normal cells through a virtual power line based on a power voltage supplied from the power wiring structure through the through via and a power line.

Integrated circuit device including normal cells and through via supplying backside power to frontside power gating cell

A semiconductor device may include a substrate including a first logic cell and a second logic cell, which are adjacent to each other in a first direction and shares a cell border, a first metal layer on the substrate, the first metal layer including a power line, which is disposed on the cell border to extend in a second direction crossing the first direction and has a center line parallel to the second direction, and a second metal layer on the first metal layer. The second metal layer may include a first upper interconnection line and a second upper interconnection line, which are provided on each of the first and second logic cells. The first upper interconnection line may extend along a first interconnection track and the first direction. The second upper interconnection line may extend along a second interconnection track and in the first direction.

Cooling device semiconductor device including end curved interconnection lines

An integrated circuit includes a first cell including a first lower pattern extending in a first direction along a first track in a first wiring layer; and a second cell including a second lower pattern that extends in the first direction along the first track in the first wiring layer, and is a minimum space of the first wiring layer or farther apart from the first lower pattern, wherein the first lower pattern corresponds to a pin of the first cell, and the second lower pattern is farther apart from a boundary between the first cell and the second cell than the first lower pattern is.

Integrated circuit providing increased pin access points and method of designing the same

Disclosed is a semiconductor device comprising a mixed height cell on a substrate, and a first power line and a second power line that run across the mixed height cell. First to third line tracks are defined between the first power line and the second power line. A fourth line track is defined adjacent to the second power line. The second power line is between the third line track and the fourth line track. The mixed height cell includes a plurality of lower lines aligned with the first to fourth line tracks. A cell height of the mixed height cell is about 1.25 times to about 1.5 times a distance between a first point of the first power line and a corresponding second point of the second power line.

Semiconductor devices

A semiconductor device includes a substrate having an active region, a first group of standard cells arranged in a first row on the active region of the substrate and having a first height defined in a column direction, a second group of standard cells arranged in a second row on the active region of the substrate, and having a second height, and a plurality of power lines extending in a row direction and respectively extending along boundaries of the first and the second groups of standard cells. The first and second groups of standard cells each further include a plurality of wiring lines extending in the row direction and arranged in the column direction, and at least some of wiring lines in at least one standard cell of the first and second groups of standard cells are arranged at different spacings and/or pitches.

Semiconductor device

A semiconductor device is provided. The semiconductor device includes a substrate including a first dummy region and a second dummy region spaced apart from the first dummy region; a device isolation layer filling a trench between the first dummy region and the second dummy region; a first dummy electrode provided on the first dummy region; a second dummy electrode provided on the second dummy region; a power line extending from the first dummy region to the second dummy region, the power line including an expanded portion provided on the device isolation layer, a width of the expanded portion being larger than a line width of a remaining portion of the power line; a power delivery network provided on a bottom surface of the substrate; and a through via extending through the substrate and the device isolation layer, and electrically connecting the power delivery network to the expanded portion. The through via and the expanded portion vertically overlap.

A semiconductor device includes a first standard cell disposed on a substrate in a first row and having a first cell height; a second standard cell disposed on the substrate in a second row, adjacent to the first row, second standard cell having a second cell height, different from the first cell height; and a power line extending in a first direction along a boundary between the first standard cell and the second standard cell.

Semiconductor device having active fin pattern at cell boundary

An integrated circuit includes a first column including a plurality of first cells aligned and placed in a plurality of first rows, each first row having a first width and extending in a first horizontal direction, a second column including a plurality of second cells aligned and placed in a plurality of second rows, each second row having a second width and extending in the first horizontal direction, and an interface column extending in a second horizontal direction perpendicular to the first horizontal direction between the first column and the second column, wherein the interface column includes at least one well tap configured to provide a first supply voltage to a well, and at least one substrate tap configured to provide a second supply voltage to a substrate.

Integrated circuit including cells of different heights and method of designing the integrated circuit

A semiconductor device is provided. The semiconductor device includes first and second logic cells adjacent to each other on a substrate, and a mixed separation structure extending in a first direction between the first and second logic cells. Each logic cell includes first and second active fins that protrude from the substrate, the first and second active fins extending in a second direction intersecting the first direction and being spaced apart from each other in the first direction, and gate electrodes extending in the first direction and spanning the first and second active fins, and having a gate pitch. The mixed separation structure includes a first separation structure separating the first active fin of the first logic cell from the first active fin of the second logic cell; and a second separation structure on the first separation structure. A width of the first separation structure is greater than the gate pitch.

A cell architecture is provided. A cell architecture including a vertical field effect transistor (VFET) having at least two fins serving as a vertical channel, a gate including a first gate portion surrounding the first fin, a second gate portion surrounding the second fin, and a third gate portion providing connection therebetween, and a top source/drain (S/D) including a first top S/D portion on the first fin and a second top S/D portion on the second fin, a gate contact structure connected to the third gate portion, a top S/D contact structure connected to one of the first top S/D portion or the second top S/D portion and serving as a horizontal conductive routing layer; and metal patterns on the gate contact structure and the top S/D contact structure and connected thereto through vias, and serving as a vertical conductive routing layer may be provided.

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Hwaseong-si, South Korea

Jungho Do