Techwing Co., Ltd.

Jung-Woo Hwang

Yun-Sung Na

Tae-Hung Ku

In-Gu Jeon

Jae-Gyun Shim

An opener for a test handler is provided. Even when holding members of inserts of a carrier board are manipulated to release semiconductor devices that have been in a held state, a predetermined distance can remain between an upper surface of the opening plate and a lower surface of the insert, thus preventing the inserts from becoming defective.

Opener for test handler

A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.

Growing community of inventors

Hwaseong-si, South Korea

Jung-Woo Hwang