Hyundai Motor Company

Kia Motors Corporation

Ewha University-industry Collaboration Foundation

Kia Corporation

Jung Suk Oh

Young Su Kim

Byoung Ju Choi

Joo Young Seo

Seung Yeun Jang

Sueng Wan Yang

Hae Young Kwon

Hae Yun Kwon

Jin Yong Lim

Sueng-Wan Yang

The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.

System test apparatus

The present invention relates to an exception handling test apparatus and method. The exception handling test apparatus includes a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, a hooking module configured to hook the device driver using the modified device driver, a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, and an analysis module configured to analyze the collected test information.

Exception handling test apparatus and method

The present invention relates to a communication test apparatus. The communication test apparatus includes an insertion module configured to insert a test agent into the process control block, a hooking module configured to hook a test target to a test code using the test agent when an event-related to communication occurs between the plurality of processes, a scanning module configured to collect pieces of test information about communication between the plurality of processes when the test target is hooked to the test code, and a logging module configured to store the pieces of test information collected by the scanning module.

Communication test apparatus and method

Growing community of inventors

Gwangmyeong, South Korea

Jung Suk Oh