Samsung Display Co., Ltd.

Korea Advanced Institute of Science and Technology

Jung Hoon Kong

Sanghoon Kim

Seungho Kim

Dong Gyu Kim

Seongjin Hwang

Minsang Koo

Do Kyung Kim

An impact test apparatus includes a base plate having an upper surface on which a specimen is placed, a collision member that collides with the specimen, a dropping unit that drops the collision member from an upper area of the specimen to the specimen and adjusts a height that the collision member drops, a velocity measurement unit that measures a collision velocity of the collision member when the collision member collides with the specimen, and an evaluation unit that produces a representative value that is a collision velocity at which a probability of breakage of the specimen is about 50%, and evaluates an impact resistance of the specimen based on the representative value.

Impact test apparatus and impact test method

Growing community of inventors

Daejeon, South Korea

Jung Hoon Kong