Lg Philips Lcd Co., Inc.

Jung Ho Kil

Don Gyou Lee

Ki Yeon Song

Oh Hyun Lee

Moon Chul Jeong

The method and apparatus for measuring response time of liquid crystal includes controlling temperature of a liquid crystal display panel, generating a liquid crystal driving signal having a variable voltage level that is changed according to a response property of the liquid crystal display panel and a target voltage level, and supplying the liquid crystal driving signal to the liquid crystal display panel, detecting the response property corresponding to the liquid crystal driving signal, and adjusting the variable voltage level until the response property reaches a desired level and setting a modulated data substantially equal to the variable voltage level when the response property reaches the desired level, the modulated data based on temperatures being determined by changing the temperature of the liquid crystal display panel. Also, method and apparatus for driving a LCD device using the above-described method.

Method and apparatus for measuring response time of liquid crystal, and method and apparatus for driving liquid crystal display device using the same

An image quality analysis method and an image quality analysis system for a display device are provided. The image quality analysis method for a display device includes the steps of outputting an image pattern for analysis of an image quality of the display device, dividing a screen display region to which the image pattern is output into a plurality of sub-regions, producing measurement data representing the image quality with respect to each of the plurality of sub-regions, arranging the produced measurement data as a time series, obtaining a fractal dimension exponent from the data as a time series, and evaluating the fractal dimension exponent as a level of uniformity of the image quality of the display device.

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Kyoungsangbuk-do, South Korea

Jung Ho Kil