Samsung Electronics Co., Ltd.

June-Hyeok Im

Chul-Jin Kim

Chul-Hyun Park

Hyun-Kuk Choi

Sang-Yun Hwang

Jong-rim Lee

Ki-uk Kim

Sae-Rome Kim

Min-Woong Ha

An apparatus and method for human body communication in a mobile communication system are provided. A portable terminal includes a human body communication module and a controller. The human body communication module performs human body communication. The controller performs a process to perform connection with an external device through the human body communication and then perform an operation executable through the human body communication.

Apparatus and method for human body communication in a mobile communication system

Disclosed is an apparatus and method for signal detection according to frequency bands used in an RFID system. The apparatus includes a low-noise amplifier for low-noise amplifying a received signal, a receiver unit for detecting a CW signal and a tag signal, a transmitter unit for frequency up-converting and outputting an input signal, a PLL for generating a frequency signal according to a transmission signal band or a reception signal band, a receiver unit switch for connecting the receiver unit with the low-noise amplifier or a directional coupler, an antennas switch for connecting the antenna with the directional coupler or low-noise amplifier, and a controller unit for controlling a frequency of the frequency signal generated by the PLL, turning off transmission power in a case of an LBT scheme, controlling the receiver unit switch and the antenna switch, and determining if a corresponding channel is an idle channel.

Method and apparatus for signal detection in radio frequency identification system

A circuit for reducing leakage current in a processor of an electronic apparatus, the processor having a joint test action group (JTAG) test terminal, is disclosed, which includes an initialization test pin included in the JTAG test terminal; a reset pin of the processor; and a semiconductor device connected between the initialization test pin and the reset pin, wherein the initialization test pin, the reset pin, and the semiconductor device are arranged to enable forward current to flow from the initialization test pin to the reset pin through the semiconductor device.

Circuit for reducing leakage current in a processor

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Seoul, South Korea

June-Hyeok Im