Samsung Electronics Co., Ltd.

June-Hong Park

Bong-Soon Lim

Chang-Yeon Yu

Il-Han Park

Seong-Jin Kim

Jin-Young Kim

Ki-Whan Song

Joon-Young Park

Su-Chang Jeon

Dong-kyo Shim

Joo-Yong Park

TaeHyun Kim

Jinyub Lee

Sungwhan Seo

Kui-Han Ko

Jin-Yub Lee

Chi-Weon Yoon

Ji-Ho Cho

Sang-Soo Park

Bilal Ahmad Janjua

Dongkyo Shim

Jungyu Lee

Ji-Hoon Lim

Vivek Venkata Kalluru

Soo-Han Kim

To program in a nonvolatile memory device including a cell region including first metal pads and a peripheral region including second metal pads and vertically connected to the cell region by the first metal pads and the second metal pads, a memory block is provided with a plurality of sub blocks disposed in a vertical direction where the memory block includes a plurality of cell strings each including a plurality of memory cells connected in series and disposed in the vertical direction. A plurality of intermediate switching transistors are disposed in a boundary portion between two adjacent sub blocks in the vertical direction. Each of the plurality of intermediate switching transistors is selectively activated based on a program address during a program operation. The selectively activating each of the plurality of intermediate switching transistors includes selectively turning on one or more intermediate switching transistors in a selected cell string based on the program address.

Nonvolatile memory device with intermediate switching transistors and programming method

To program in a nonvolatile memory device, a memory block is provided with a plurality of sub blocks disposed in a vertical direction where the memory block includes a plurality of cell strings each including a plurality of memory cells connected in series and disposed in the vertical direction. A plurality of intermediate switching transistors are disposed in a boundary portion between two adjacent sub blocks in the vertical direction. Each of the plurality of intermediate switching transistors is selectively activated based on a program address during a program operation. The selectively activating each of the plurality of intermediate switching transistors includes selectively turning on one or more intermediate switching transistors in a selected cell string based on the program address.

A nonvolatile memory device includes a bank and a program current generator. The bank includes a memory cell array that includes phase change memory cells storing data based on a program current, and the transfer element transfers the program current to the memory cell array through current mirroring. The program current generator generates the program current based on a reference current.

Nonvolatile memory device including transfer element

A nonvolatile memory device and a method of manufacturing the device, the device including a first semiconductor layer, the first semiconductor layer including an upper substrate, and a memory cell array, the memory cell array including a plurality of gate conductive layers stacked on the upper substrate and a plurality of pillars passing through the plurality of gate conductive layers and extending in a direction perpendicular to a top surface of the upper substrate; and a second semiconductor layer under the first semiconductor layer, the second semiconductor layer including a lower substrate, at least one contact plug between the lower substrate and the upper substrate, and a common source line driver on the lower substrate and configured to output a common source voltage for the plurality of pillars through the at least one contact plug.

Nonvolatile memory device and method of manufacturing the same

A nonvolatile memory device including a memory cell array having a plurality of planes; a plurality of page buffers arranged corresponding to each of the plurality of planes; and a control logic circuit configured to transmit a bit line setup signal to each of the plurality of page buffers. Each of the plurality of page buffers includes a precharge circuit configured to precharge a sensing node and a bit line in response to the bit line setup signal, and a shutoff circuit configured to perform a bit line shutoff operation in response to a bit line shutoff signal. The control logic circuit is configured to control a transition time when a level of the bit line setup signal is changed according to a gradient of the bit line shutoff signal which is changed from a first level to a second level.

Nonvolatile memory device

A nonvolatile memory device includes a plurality of gate lines extending in a first direction and stacked in a second direction to form a memory block, where the second direction is perpendicular to the first direction, an address decoder disposed at a first side of the plurality of gate lines to drive the plurality of gate lines, a voltage compensation line extending in the first direction substantially in parallel with the plurality of gate lines, and overlapping with a target gate line among the plurality of gate lines in the second direction, a rising vertical contact extending in the second direction to connect the address decoder and a first portion of the voltage compensation line, and conduction paths connecting in the second direction the first and second portions of the voltage compensation line with near and far end portions of the target gate line.

Nonvolatile memory device compensating for voltage drop of target gate line

A non-volatile memory device includes a cell string, a ground select transistor, and at least one dummy cell. The cell string includes at least one memory cell. The at least one dummy cell is provided between the at least one memory cell and the ground select transistor and is connected to a bit line. A controller executes dummy cell control logic configured to control a gate voltage of the at least one dummy cell to be lower than a threshold voltage of the at least one dummy cell in at least a part of a pre-charge period.

Non-volatile memory device having dummy cells and memory system including the same

Disclosed is a nonvolatile memory device. The nonvolatile memory device includes a cell array including a plurality of memory cells, a page buffer including a plurality of latch sets, and a control logic. The page buffer is connected to the cell array through bit lines. The latch sets respectively are configured to sense data from selected memory cells among the memory cells through the bit lines. The latch sets respectively are configured to perform a plurality of read operations to determine one data state. The latch sets are respectively configured to store results of the read operations. The control logic configured to control the page buffer such that the latch sets sequentially and respectively store the results of the read operations, to compare data stored in the latch sets with each other, and to select one latch set among the latch sets based on the comparison result.

Nonvolatile memory device and read method thereof

An external power control method includes determining whether to apply a second external voltage to a first node according to a drop of a first external voltage; generating a flag signal according to a drop of the second external voltage when the second external voltage is applied to the first node; transferring a voltage of the first node to a second node in response to the flag signal; and discharging at least one voltage of an internal circuit connected to the second node in response to the flag signal.

Nonvolatile memory device, memory system having the same, external power controlling method thereof

A nonvolatile memory device includes a voltage supply controller (VSC) detecting a level of a power supply voltage and generating a first internal voltage in response thereto. The VSC provides the first internal voltage at a level equal to an external high voltage when a power supply voltage is normally supplied, but provides the first internal voltage at a level lower than the external high voltage when a power supply voltage is abnormally supplied.

Voltage supply controller, nonvolatile memory device and memory system

A programming method for a non-volatile memory device includes performing a programming operation to program memory cells, when the programmed memory cells are determined to include memory cells that failed to be programmed and when a current program loop is a maximum program loop, determining whether a number of the memory cells that failed to be programmed corresponds to a number of memory cells that can successfully undergo ECC (error checking and correction), when the number of the memory cells that failed to be programmed is less than the number of the memory cells that can successfully undergo ECC, reading data so as to determine whether a number of error bits of the memory cells that failed to be programmed can successfully undergo ECC, and, when the memory cells that failed to be programmed can successfully undergo ECC, ending a programming operation.

Non-volatile memory device and associated programming method using error checking and correction (ECC)

A flash memory device includes a memory cell array and a multi-buffer block which temporarily stores program data that are to be stored in the memory cell array, wherein the multi-buffer block includes a plurality of buffer circuits which store at least 2-word data, respectively. Each of the buffer circuits includes a plurality of registers which store two corresponding data bits among the at least 2-word data, respectively and scan logics corresponding to the registers, respectively, which scan a number of program data of a first word data among the at least 2-word data during a first scan interval, and which scan a number of program data of a second word data among the at least 2-word data based on the number of the program data of the first word data during a second scan interval.

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Seongnam-si, South Korea

June-Hong Park