Q-silicon Technologies Corp.

Jun-Yuan Chen

Cheng-Chung Yeh

Chih-Te Hung

The present invention provides a detection circuit, which comprises a first detection path and a second detection path for detecting the state of a power source under test. A first current is generated on the first detection path according to power source under test; a second current is generated on the second detection path according to the power source under test. The detection circuit generates a detection signal according to the first current and the second current. The detection signal represents the state of the power source under test.

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Taipei, Taiwan

Jun-Yuan Chen