Samsung Electronics Co., Ltd.

Postech Academy-Industry Foundation

Jun-young Park

Byung-Se So

Sung-bum Cho

Woo-seop Kim

Ki-jae Song

Nasir Desai

Hyun-Chul Kang

Yeon-mo Jeong

Ung-jin Jang

Sung-gu Lee

Abhinav Mehrotra

Hong-seok Yeon

Sung-Je Hong

An apparatus for processing a medical image includes an image processor including a plurality of processors, the plurality of processors configured to reconstruct a cross-sectional image of an object by performing a first operation having a first priority and a second operation having a second priority that is lower than the first priority, and a controller configured to monitor whether a malfunction occurs among the plurality of processors, and configured to assign, to at least one of the plurality of processors, at least one of the first operation and the second operation to be performed, based on a result of monitoring of the plurality of processors.

Apparatus for processing medical image and method of processing medical image thereof

A semiconductor device and a test apparatus including the same, the semiconductor device including a command distributor receiving a serial command that is synchronized with a first clock signal and converting the serial command into a parallel command, a command decoder receiving the parallel command and generating a pattern sequence based on the parallel command, and a signal generator receiving the pattern sequence and generating operating signals synchronized with a second clock signal, wherein a frequency of the first clock signal is less than a frequency of the second clock signal.

Semiconductor device and test apparatus including the same

A test apparatus capable of detecting input/output (I/O) circuit characteristics of a semiconductor device by analyzing an eye mask generated in the test apparatus and the waveform of a test signal output from the I/O circuit of the semiconductor device. The test apparatus includes an eye mask generator that generates an eye mask in synchronization with one or more clock signals of opposite phase to each other, an error detector that receives the eye mask from the eye mask generator and compares the test signal with the eye mask to determine whether an error occurs in the semiconductor device, and an error signal output unit that receives an error detection signal from the error detector and generates an error signal in response to the error detection signal. In particular, the eye mask generator includes a sine wave generator that generates one or more sine waves of opposite phase to each other in synchronization with one or more clock signals, and a limiter circuit that receives the sine waves and generates the eye mask by adjusting the amplitudes of the sine waves.

Apparatus and method for testing circuit characteristics by using eye mask

Growing community of inventors

Pohang-si, South Korea

Jun-young Park