Samsung Display Co., Ltd.

Jun Yeong Park

Kwang Taek Hong

Hwa Sung Woo

A method of inspecting a display substrate including pixel patterns provided in pixel areas disposed in a display area in a first direction and a second direction may include obtaining a captured image of the pixel patterns of the display substrate, grouping pixels included in the captured image by grouping at least two pixels disposed in the first direction into a pixel group, designating each pixel group included in the captured image as a target pixel group, comparing pixel patterns of the target pixel group with pixel patterns of an adjacent pixel group positioned in a third direction with respect to the target pixel group, and determining whether the pixel patterns of the target pixel group are defective.

Growing community of inventors

Yongin-si, South Korea

Jun Yeong Park