Lotte Confectionery Co., Ltd.

Samsung Electronics Co., Ltd.

Jun-Sung Kim

Yoon-Soo Lee

Ik-Boo Kwon

Kee-Hyun Choi

Jang-Youn Choi

Kwang-Yung Cheong

Byung-Wook Choi

In a method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment, resistance values of pads of a probed chip are measured and stored. If a maximum resistance value among the stored resistance values is greater than a contact resistance reference value, a consecutive fail counting value and an accumulated fail counting value are increased. An automatic sanding command is generated to activate automatic sanding of a probe tip, when at least one of the consecutive fail counting value and the accumulated fail counting value is greater than a respective counting reference value. In this manner, false negative readings in the testing of semiconductor devices as the result of increased contact resistance between a probe tip and a pad in an EDS test are reduced and therefore device yield is improved.

Method of controlling probe tip sanding in semiconductor device testing equipment

The present invention relates to a method for producing high amounts of Monascus pigment by cultivating a Monascus species in a particularly prepared media to which rice powder and peptone are added as carbon and nitrogen sources, respectively.

Method for hyper-production of monascus pigments

The present invention relates to Monascus anka 732Y3 (KCCM 10014 induced from Monascus anka ATCC 16360 (=IFO 4478, KFCC 11832), and more particularly is concerned with Monascus anka 732Y3 (KCCM 10014), which was induced from Monascus anka ATCC 16360 (=IFO 4478, KFCC 11832) by ultra-violet light irradiation and produces higher amounts of pigments than Monascus anka ATCC 16360.

Monascus strain, Monascus anka 732Y3 (KCCM 10014) producing high amount

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Seoul, South Korea

Jun-Sung Kim