Jasco Corporation

Jasco International Co., Ltd.

Jun Koshoubu

Kenichi Akao

Toshiyuki Nagoshi

Noriaki Soga

Tetsuji Sunami

Seiichi Kashiwabara

Hiroshi Sugiyama

Mitsuo Watanabe

Takashi Inoue

Keisuke Watanabe

Shigeru Ito

Tomohiro Katsumata

Takayuki Sera

Masaaki Yumoto

Yoshiko Akao

Hiroshi Tsukada

Kazuya Nakagawa

A multiple-reflection apparatus and a multiple-reflection cell includes: a pair of parallel plane mirrors that multiply reflects a laser light, in zigzag, which enters at a specific angle of incidence; a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled to one end between the parallel plane mirrors; and a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled from the right-angle double mirror on one end side to the other end between the parallel plane mirrors. When the two parallel mirror surfaces configuring the parallel plane mirrors are disposed to be parallel to the z-x plane of the x-y-z axial coordinate system, the two reflection surfaces configuring the right-angle double mirror are perpendicular to the x-y plane, and the laser light entering at the angle φ of incidence crosses the x-y plane at a specific angle.

Multiple-reflection apparatus and multiple-reflection cell

Measuring apparatus comprises a rotating plate, a torque detection platedisposed on a same axis parallel to the platewith a given gap, a torque sensor about the platethrough the specimen held between two plates. The plateis a total reflection prism which is made from a material that has a greater refractive index than the specimen and transmits UV and infrared light. An ultraviolet beam is directed onto the specimen through the prism. An infrared beam is directed into the prism. The infrared beam emerging from the prism after total reflection from the interface between the prism and the specimen is detected. A signal processor analyzes the infrared absorption spectrum of the specimen on the basis of the infrared beam. While the viscosity of the specimen in the curing process is measured, the signal processor simultaneously measures the infrared absorption spectrum.

Ultraviolet curing resin property measuring apparatus

A circular dichroism (CD) spectrometer includes an alignment mechanism that automatically adjusts the elements thereof at appropriate positions. The spectrometer has a focusing-lens position-and-orientation adjustment mechanism which adjusts the position and the orientation of the detector-side focusing lens. It also has a detector rotation mechanism which adjusts the orientation of the detector. Firstly, a control PC monitors the CD spectrum of D form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum matches the reference spectrum related to the D form. Next, the control PC moniters CD spectrum of L form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum of the D and L forms become symmetrical. And, the rotation mechanism adjusts the orientation of the detector such that the intensity of the detector signal is maximized.

Circular dichroism spectrometer having alignment mechanism

An object of the present invention is to provide a total reflection measuring apparatus which, while visually observing a specific minute area of a measurement object, is capable of efficiently obtaining optical data on the basis of the total reflection measurement. A microscopic total reflection measuring apparatus of the present invention comprises a Cassegrain mirrorhaving a Cassegrain primary mirrorand a Cassegrain secondary mirror, which condenses an incident light beamon a measurement objectby making an incident light beam successively reflected by the secondary mirrorand the primary mirror, and which obtains a reflected light beamfrom the measurement objectby making the reflected light beamsuccessively reflected by the primary mirrorand the secondary mirror. And, a total reflection prismis arranged below the Cassegrain secondary mirror. And the incident light beam includes a visible light beam for visual observation and a measurement light beam for acquisition of analysis information, and present invention comprises a visible light filter which separates at least one of the incident light beam to the total reflection prism and the reflected light beam from the total reflection prisminto a total reflection area B and a normal reflection area A, and which removes, from the one of the incident light beam and the reflected light beam, the visible light beam in the total reflection area B.

Microscopic total reflection measuring apparatus

A microscopic-measurement apparatus capable of displaying, on a display device, an enlarged view of a particular part of a specimen placed on a movable stage and providing optical information of a desired portion includes an observation-image display section for displaying an enlarged view of a specific part of the specimen on the display device; a thumbnail-image display section for acquiring the enlarged image of the specific part as a thumbnail image when the enlarged observation image is specified and displaying the thumbnail image together with the enlarged image on the display device; a thumbnail-coordinate storage section for storing coordinate information of the specific part, where the thumbnail image is acquired, in association with the thumbnail image; and a thumbnail jump display section for causing the observation-image display section to display an enlarged image of the position of the thumbnail image by specifying the thumbnail image.

Microscopic-measurement apparatus

A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler.

Microscope

A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system. The microscopic-measurement apparatus for acquiring optical information from desired portions of a sample by moving a measuring optical axis on a surface of the sample includes an observation-image display section for displaying a sample surface image as an observation image, in a range of visual field which is observable at a present sample position; an optical-axis display section for displaying areas to be measured and a present position of the measuring optical axis in an overlapped state with the observation image; an area setting section capable of setting measuring areas by expanding, reducing, changing in shape and moving the areas to be measured; and an optical-information acquisition section for measuring one set measuring area or several set measuring areas successively with an instruction of starting measurement.

A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.

Noise-component removing method

The present invention provides an attenuated-total-reflection ('ATR') measurement apparatus that collects light onto a contact surface between a sample and an ATR prism at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus according to the invention includes: a light-irradiating system for emitting the light which is collected onto the contact surface; a photodetector for detecting the total-reflection light from the contact surface; an aperture for restricting the light which the photodetector detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror provided in a light path extending from the ATR prism to the aperture.

Attenuated-total-reflection measurement apparatus

A mapping-measurement apparatus includes a light illumination unit, a photodetector for detecting, through an aperture, reflection light or transmission light from a sample, and adjustable scanning mirrors on the illumination and detection sides of the sample, each mirror having two independent rotational axes about which they can be independently rotated by a controller. The aperture restricts light incident on the photodetector from a predetermined portion of the sample surface.

Mapping-measurement apparatus

The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy. An infrared circular dichroism measuring apparatuscomprising: AC signal extractorswhere an interference light beam from an IR light sourcewhich has passed an interferometeris converted into a clockwise and a counterclockwise circularly polarized light beams and is irradiated on a sample to extract from a detected signal of detectoran interferogram by each of the circularly polarized light beams; DC signal extractorsfor extracting an interferogram by the IR absorption of the sample; a calculatorfor figuring out the circular dichroism; and a selective transmitterfor narrowing down the wavelength region to be measured based on an IR absorption wavelength region corresponding to a vibration mode of the structure to be measured in the sample molecule.

Infrared circular dichroism measuring apparatus and infrared circular dichroism measuring method

A method capable of acquiring data at a high speed while holding proper precision during measurement with an infrared imaging apparatus uses an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method which acquires data from a multi-element detector in an infrared imaging apparatus. The method involves starting to scan an element of the said multi-element detector synchronously with a sampling signal based on a reference signal of an interferometer, and scanning the element at a higher frequency than a sampling frequency of the sampling signal. The method further involves completing the scanning of all the elements before a next sampling signal to the sampling signal starting the element scanning is generated, and repeating a series of operations every time the sampling signal is generated.

Method of acquiring data from multi-element detector in infrared imaging apparatus

It is an object of the present invention to provide a data acquiring method in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of scanning each element of the multi-element detector in order synchronously with a sampling signal () generated by a reference signal () of an interferometer and repeating a series of scanning operations after completely scanning all the elements, thereby carrying out scan, shifting a starting point of sampling in next scan by one element from the starting point of the previous scan, thereby carrying out the same scanning, and repeating the scan at the number of times corresponding to the number of all the elements and then extracting data for each element from storing sampling data, thereby acquiring a data sequence of all the sampling points for each element.

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Hachioji, Japan

Jun Koshoubu