Jasco Corporation

Jun Koshobu

Hiroshi Sugiyama

Keisuke Watanabe

Tetsuji Sunami

Noriaki Soga

Takashi Shimamura

Kento Aizawa

Tsubasa Asatsuma

Masaru Shimizu

Norio Wakimoto

A circular dichroism measurement apparatus includes a laser light source (QCL) capable of sweeping a wavenumber of a laser light in an infrared wavenumber range containing at least one peak of the sample; a sample chamber where the sample is disposed; a photoelastic modulator that modulates a polarization state of the laser light before or after the laser light of a specific wavenumber in a wavenumber sweep transmits the sample; a detector that detects a variation in intensity of the laser light which transmitted the sample and of which its polarization state is modulated; and a signal processing device that extracts an alternating-current component (AC) that synchronize with a modulation frequency and a direct-current component (DC) from a detected signal of the detector, and calculates a value of infrared circular dichroism of the sample based on a ratio (AC/DC) of the AC and DC.

Infrared circular dichroism measurement apparatus

To provide a total reflection measurement device that can improve a light utilization rate more than a Cassegrain type objective mirror, is capable of total reflection measurement at low magnification, and can maintain compatibility with a conventional objective mirror. The device () includes: a pair of plane mirrors () disposed on a central axis (P); a pair of intermediate mirrors () opposing to the plane mirrors (), respectively; a pair of ellipsoidal mirrors () opposing to the intermediate mirrors (), respectively; and an ATR crystal () provided at a position nearer to the sample side than the pair of plane mirrors () on the central axis (P). The ellipsoidal mirrors () are provided so that each one focal position (C) formed by the intermediate mirror () and the plane mirror () are at same position on the central axis (P), and each another focal position (C) formed by only the intermediate mirror () are also at same position on the central axis (P). Further, the another focal position (C) coincides with a boundary surface between the ATR crystal () and the sample.

Total reflection measurement device

An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle &#x3b8;c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle &#x3b8;c' of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.

Optical instrument for measuring total reflection absorption spectrum and measuring device

A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength &#x3bb;1 of a semi-conductor laser, and a step of interpolating intensity signals (I1', I2&#x2032;, . . . ) that would be obtained when the interference wave is sampled at positions (D1&#x2032;, D2&#x2032;, . . . ) of the movable mirror set on the basis of a wavelength &#x3bb;0 of a He&#x2014;Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1&#x2032;, I2&#x2032;, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength &#x3bb;0.

Spectrum measurement method using fourier transform type spectroscopic device

The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk. The infrared microscopecomprises a light source, an irradiating unitfor irradiating the infrared light from the light source to a sample, a focusing unitfor focusing the infrared light transmitted through or reflected by the sample, and a detectorfor detecting the focused infrared light. The irradiating unitcomprises a first aperture, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unitcomprises a second aperture, and the second aperture is disposed at an imaging position of the infrared light at the first aperture. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detectorto detect the infrared light as a detecting light. The second aperturehas holes that have the same size and arrangement as the first aperture

Infrared microscope

A depolarizer includes a pair of wedge-shaped plates made of an optically isotropic material, laid one on top of another such that the total thickness is constant and wedge-plate holding means for holding the pair of wedge plates separately. The wedge-plate holding means includes a pressure-applying section for applying pressure to each of the pair of wedge plates in a direction perpendicular to the thickness direction of the pair of wedge plates. The pressure-applying direction for one of the pair of wedge plates and the pressure-applying direction for the other of the pair of wedge plates intersect at an angle of 45 degrees.

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Tokyo, Japan

Jun Koshobu