Other

Fujitsu Corporation

Subaru Corporation

Chugai Seiyaku Kabushiki Kaisha

Ando Electric Company

Nippon Telegraph and Telephone Corporation

Fuji Jukogyo Kabushiki Kaisha

Jun Kikuchi

Mitsuru Shinagawa

Tadao Nagatsuma

Yoshiki Yanagisawa

Nobuaki Takeuchi

Yoshio Endou

Shuzo Fujimura

Junzo Yamada

Nobukazu Banjo

Kazuyoshi Matsuhiro

Yoshimi Imaeda

Masaya Kakuta

Hidefumi Mizushima

Mami Osawa

Haruhiko Serizawa

Ryo Kurosaki

Masao Iga

Daichi Akiyama

Takashi Nozaki

Hakaru Kyuragi

Akishige Ito

Yoshitaka Arai

Miki T Suzuki

Mitsuaki Nagasaka

Hiroki Ogawa

Sanjay Gupta

Mamoru Akita

Nobukazu Banjou

Shigeru Takehisa

Hideki Koshiishi

Haruhisa Matsumoto

A vehicle control apparatus includes a control system. The control system includes a processor and a memory that are communicably coupled to each other, and executes a polarization eliminating mode in which polarization is eliminated by controlling an energization state of an electric power storage device while a vehicle is traveling. The control system sets a first necessary time to eliminate the polarization based on a polarization state of the electric power storage device, acquires a second necessary time to an arrival of the vehicle at a destination, permits the polarization eliminating mode to be executed while the vehicle is traveling in a case where the first necessary time is shorter than or equal to the second necessary time, and refrains from permitting the polarization eliminating mode to be executed while the vehicle is traveling in a case where the first necessary time is longer than the second necessary time.

Vehicle control apparatus

A charging control apparatus includes a battery, an electric charge mover, and a processor. The battery includes multiple cells. The electric charge mover is configured to move electric charge between the multiple cells. The processor is configured to, upon charging the battery, cause the electric charge mover to move the electric charge of one or more cells serving as a part of the multiple cells to another one or more cells of the multiple cells, and perform a partial charging that charges the one or more cells serving as the part of the multiple cells after causing the electric charge mover to move the electric charge.

Charging control apparatus

A vehicle control device includes a remaining capacity detecting module that detects a remaining capacity of a secondary battery which supplies an electric power to the drive motor, and a cruise mode switching module that switches a cruise mode from the first cruise mode to the second cruise mode on the basis of the remaining capacity, and switches the cruise mode from the second cruise mode to the first cruise mode on the basis of an external charging.

Vehicle control device and vehicle

Antibody-containing solution formulations including a sugar as a stabilizer. Said solution formulations can further include a surfactant as a stabilizer.

Antibody-containing solution formulations

Antibody-containing solution pharmaceuticals

A charged particle measuring apparatus discriminates the types of charged particles accurately and the energy precisely, measures high-energy charged particles precisely, and detects a failure of the apparatus to continue measurement in a mode corresponding to the failure. Outputs from first and second detectors are used as first and second addresses, respectively. The second detector includes a plurality of detectors. The output from a third detector is used as information about whether or not certain charged particles penetrate the second detector. The loss energy characteristics of charged particles to be measured are expressed in the first and second addresses. The number of times the charged particles are measured for loss energy are counted with respect to the addresses. When the series of detectors constituting the first, second, and third detectors suffers a failure, a measurement mode excluding any failed detector is employed to continue measurement.

Charged particle measuring apparatus

An electro-optic sampling apparatus is provided to enable measurement on potentials of signals on the conductor of coaxial cable with high precision and with ease. Herein, an electric input connector inputs a measured electric signal, which is introduced to a conductive path such as a microstrip line. An electro-optic material (e.g., Bi SiO ) that provides electro-optic effect such as Pockel's effect is fixed to a bare portion of the conductive path and is varied in birefringence ratio in response to strength of electric field caused by the conductive path through which the measured electric signal transmits. The conductive path is then terminated by a terminal device. Now, a laser beam is radiated toward the electro-optic material, wherein it is varied in polarization in response to variations of the birefringence ratio. Then, the laser beam is reflected by a dielectric mirror and is separated into two beams by a polarization beam splitter. Photodiodes are provided to convert the two beams to electric signals representing potentials. Thus, the apparatus measures voltage of the measured electric signal based on the electric signals.

Electro-optic apparatus for measuring signal potentials

An electro-optic probe has a laser diode for emitting a laser beam in accordance with a control signal from a measuring instrument main body, an electro-optic or magneto-optic element provided with a reflection film on an end surface thereof, a separator provided between the laser diode and electro-optic or magneto-optic element which is pervious the laser beam emitted from the laser diode and separates a beam reflected from the reflection film and two photodiodes which transform the beam reflected by the separator. A member of weak dielectric material, such as a glass plate, overlies the electro-optic or magneto-optic element at the end of the probe to protect the element, or the element is at the end of the probe and is exposed.

Electro-optic probe and magneto-optic probe

An electro-optic sampling oscilloscope (or EOS oscilloscope) uses an electro-optic probe containing an electro-optic crystal, which is placed under effect of an electric field caused by a measured signal. Laser pulses are supplied to the electro-optic crystal wherein they are subjected to polarization. Then, measurement data representative of a waveform of the measured signal are produced in response to polarization states of the laser pulses and are stored in a measurement data storage. A user can select specific measurement data by using a list of files of multiple measurement data which is displayed on a screen. Then, the EOS oscilloscope displays an outline waveform which is created based on a reduced number of sample points extracted from the selected measurement data. Comments and/or measurement conditions can be stored in the measurement data storage in relation to the measurement data, so that they are adequately displayed on the screen.

Electro-optic sampling oscilloscope

In a light receiving circuit for use in electro-optic sampling oscilloscope which receives first and second optical, photodiodes and are connected in series between a positive bias power supply P and a negative bias power supply N. The photodiodes and receive optical signals whose polarization state correspond to the voltage of a signal to be measured and convert the thus-received optical signals into electric signals. An amplifier amplifies an electric current appearing in a point of connection P between the photodiodes and A current monitor detects the electric signal converted by the photodiode and a current monitor detects the electric signal converted by the photodiode The electric signal detected by the current monitor is subjected to analog-to-digital conversion by an analog-to-digital converter and the electric signal detected by the current monitor is subjected to analog-to-digital conversion by an analog-to-digital converter A control section formed from a subtraction circuit controls a ratio of polarization between the optical signals such that the difference between the value of the current detected by the current monitor and the value of the current detected by the current monitor becomes smaller.

Light receiving circuit for use in electro-optic sampling oscilloscope

The present invention relates to an electro-optic sampling oscilloscope. The delay circuit in the electro-optic sampling oscilloscope comprises a delay time detecting circuit, a regulation time determining circuit, a counter circuit and a delay regulating circuit. The delay time detecting circuit detects in the trigger signal a value corresponding to the delay time of a reference clock from a reference clock generating circuit. The regulation time determining circuit determines a regulation time based on the value detected by the delay time detecting circuit so that the regulation time is an integer multiple of the reference clock. The counter circuit is triggered by the trigger signal to count the reference clock through a specific value. The delay regulating circuit employs a signal related to the regulation time from the regulation time determining circuit, to delay the signal output from the counter circuit by the regulation time.

The present invention relates to an electro-optic sampling oscilloscope which carries out measurement of a measured signal using an optical pulse generated based on a timing signal from a timing generation circuit. The timing generation circuit includes a frequency measurement circuit which generates a gate signal for a gate interval which is a specified multiple N of the cycle of the desired sampling rate, and counts the input trigger signals during the gate interval of the gate signal; a division circuit which divides the count value of said frequency measurement circuit by the specified multiple N, and determines a divider ratio; and a frequency divider which divides the trigger signals by the divider ratio determined by the division circuit, and outputs the result as the timing signal.

Timing generation circuit for electro-optic sampling oscilloscope

Timing generation circuit for an electro-optic oscilloscope

The present invention relates to an electro-optic sampling oscilloscope in which an electric field generated by a signal to be measured is coupled with an electro-optic crystal, and an optical pulse outputted from an optical pulse output circuit is caused to enter the electro-optic crystal, and the waveform of the signal to be measured is observed using the polarization state of the optical pulse. The optical pulse output circuit has as the input light thereof a sample optical pulse amplified by an optical amplifier circuit, and outputs, as an optical pulse, the output from an optical filter which blocks the propagation of the spontaneously emitted light of the optical amplifier circuit.

Oscilloscope utilizing probe with electro-optic crystal

An electro-optic sampling oscilloscope (or EOS oscilloscope) is designed to perform measurement such that an electro-optic sampling probe (i.e., EOS probe) is brought into contact with a measured circuit. Optical pulses are input to the EOS probe, wherein they are varied in polarization states in response to the measured circuit. Then, an electric signal output from the EOS probe is amplified to produce a receiving light signal. The receiving light signal is subjected to sampling operations using a first pulse signal to produce detection data, while it is also subjected to sampling operations using a second pulse signal to produce noise data. Herein, the first pulse signal consists of pulses which emerge in synchronization with the optical pulses respectively, while the second pulse signal delays from the first pulse signal by a prescribed delay time. Then, measurement data are produced by subtracting the noise data from the detection data. The measurement data are processed so that a measured waveform representing a measurement result is displayed on a screen of the EOS oscilloscope. Thus, it is possible to obtain the measured waveform with high precision and a good S/N ratio by eliminating low-frequency noise components from the measurement results.

Electro-optical oscilloscope with improved sampling

Growing community of inventors

Tokyo, Japan

Jun Kikuchi