Fujitsu Corporation

Jun'ichi Tanahashi

Ryusuke Masuoka

Kazuo Asakawa

Takashi Kimoto

Nobuo Watanabe

Akira Kawamura

Takashi Kanie

A learning system is used in a data processing apparatus for learning an input pattern by obtaining an internal-state value necessary for realizing a desired data conversion by performing a pattern conversion defined by the internal-state value and calculating an output pattern corresponding to the input pattern. The learning system comprises a pattern presenting unit for presenting an input pattern group of the subject to be learned for pattern conversion, dividing the input pattern group of the subject to be learned into at least two sets, selecting one of the divided sets, presenting the input pattern group of the selected set to a pattern conversion unit and presenting an input pattern group belonging to all the sets presented up to the current point when the internal-state value to be converged is obtained in accordance with the presentation of the selected set, and an error value calculating unit for calculating an error value representing a magnitude of a non-consistency between an output pattern group outputted in accordance with the presentation and a teacher pattern group representing a pattern to be obtained by the output pattern group.

Learning system for a data processing apparatus

A learning system is used in a data processing apparatus for learning an input pattern by obtaining an internal-state value necessary for realizing a desired data conversion by performing a pattern conversion defined by the internal-state value and calculating an output pattern corresponding to the input pattern. The learning system comprises a pattern presenting unit for presenting an input pattern group of the subject to be learned for pattern conversion, dividing the input pattern group of the subject to be learned into at least two sets, selecting one of the divided sets, presenting the input pattern group of the selected set to a pattern conversion unit and presenting an input pattern group belonging to all the sets presented up to the current point when the internal-state value to be converged is obtained in accordance with the presentation of the selected set, and an error value calculating unit for calculating an error value representing a magnitude of a non-consistency between an output pattern group outputted in accordance with the presentation and a teacher pattern group representing a pattern to be obtained by the said output pattern group.

An error correcting and controlling system having syndrome generating means for generating syndromes of data to be checked and memory means for storing error bit positions in which system the syndromes form addressing inputs to the memory so that the error bit position information stored in the address positions corresponding to each syndrome in the memory may be read out and processed for the purposes of error detection and correction. As a result, the check circuits of the present system have been simplified as compared with conventional check circuits.

Growing community of inventors

Yamato, Japan

Jun'ichi Tanahashi