Olympus Optical Company, Ltd.

Olympus Corporation

Jun Funazaki

Keisuke Saito

Hiroshi Kajimura

Hideo Tomabechi

Hiroshi Tazaki

Yasushi Nakamura

Kazuya Matsumoto

Yoshinori Ohta

Hideo Adachi

Michitsugu Arima

Masashi Kitazawa

Atsushi Yusa

Kazutaka Nishikawa

Takashi Mizusaki

Nobuhiko Morimoto

Fumitaka Ozeki

Yukiaki Minamoto

Shigeru Komiyama

A cell inspection method includes a concentrate production step, a staining step, a cell precipitation step, and an observation step. In the concentrate production step, the cell concentrate is produced by causing an inner cylinder which has a filter provided on a bottom surface to enter from the bottom surface side into the through hole of the outer cylinder and bringing the inner cylinder closer to the slide, the inner cylinder having an internal space, and in the observation step, observation is performed in a state where the inner cylinder is entered into the outer cylinder.

Cell inspection device and cell inspection method

Provided is a cell collection apparatus includes: a supporter that supports a sheet to which a back surface of a substrate is pasted, the substrate being divided in to plural small pieces with a section of a tissue pasted on a front surface thereof; a needle including needle tips; and a holder that is configured to hold the needle with the needle tips facing the sheet on an opposite side to a substrate side of the sheet, and to move the needle in the forward direction of the needle tips, wherein at least two needle tips are arranged within a region narrower than the back surface of the small piece substantially on the identical plane intersecting with the longitudinal direction of the needle.

Cell collection apparatus and cell collecting method

A group of small pieces of divided base substrate is arrayed on a sheet without gaps therebetween by means of a simple method. Provided is a substrate-sheet fabricating method including cutting into a group of small pieces a base substrate whose first-side surface is attached to a first sheet member; transferring the group of small pieces to a second sheet member by attaching the second sheet member, which can be contracted in the direction along a surface thereof, to second-side surfaces of the group of small pieces and by peeling off the first sheet member from the first-side surfaces of the group of small pieces; and making the second sheet member contract in the direction along the surface thereof.

Substrate-sheet fabricating method

An electric charge generator for use in an apparatus for producing an electrostatic latent image includes a plurality of charge generation controlling devices, each charge generation controlling device including: an insulating substrate; a line electrode formed on the insulating substrate; a solid dielectric film formed on the surface of the line electrode; a finger electrode having a hole for generating an electric charge, the hole being formed in the central part of the finger electrode, the finger electrode being formed on the solid dielectric film; a solid insulating film having a hole for passing the electric charge, the hole being formed in the central part of the solid insulating film, the solid insulating film being formed on the finger electrode; and a screen electrode having a hole for ejecting the electric charge, the hole being formed in the central part of the screen electrode, the screen electrode being formed on the surface of the finger electrode via the solid insulating film; wherein the plurality of charge generation controlling devices are arranged on the insulating substrate so as to form the electric charge generator. The solid insulating film is formed of a multilayer solid insulating film including a surface-side layer made of an inorganic insulating film and a substrate-side layer made of an organic insulating film whereby the durability and the reliability are improved.

Electric charge generator for use in an apparatus for producing an

A scanning probe microscope according to the present invention comprises a cantilever having a free end portion and a fixed end portion, the free end portion bearing a probe thereon, a semiconductor laser attached to the fixed end portion of the cantilever, an optical waveguide for guiding a laser beam, emitted from the semiconductor laser, to the free end portion, an optical element for dividing part of a center beam of the laser beam, guided through the optical waveguide, into laser beams in at least two perpendicular directions, a photoelectric transducer for receiving the divided laser beams and converting the laser beams into electrical output signals corresponding thereto, and a differential circuit for receiving the electrical signals and subjecting the signals to predetermined arithmetic processing, thereby detecting a three-dimensional displacement of the free end portion of the cantilever.

Scanning probe microscope having first and second optical waveguides

Scanning probe microscope utilizing an optical element in a waveguide

An optical waveguide apparatus comprising a substrate made of material the refractive index of which is changed by an electric effect, and an optical waveguide which is formed on a portion of the substrate and allows passage of guided light. In the apparatus, the optical waveguide includes an optical path changing section for periodically producing an electromotive force under the control of one of control light and guided light.

Optical waveguide apparatus for controlling a signal light traveling

Growing community of inventors

Hachioji, Japan

Jun Funazaki