Saint-gobain Glass France

Julien Beutier

Xavier Caillet

Nisita Wanakule

Estelle Martin

Tommaso Ongarello

Thierry Kauffmann

Soumyadeep Misra

Véronique Rondeau

Elsa-Marie Perrin

Yaël Bronstein

A computer implemented methods for estimating at least one quality function of a given layered coating on a transparent substrate allows to predict at least one non in-process measured quality function of a given layered coating on a transparent substrate from an in-process measured quality function which can be acquired on the coated substrate as deposited at any location, preferably at the end of a coating process. The method allows to get rid of in-process real-time continuous measurements of quality functions of the coated transparent substrate and real-time monitoring of coating process parameters.

Method for estimating a quality function of a mono- or multi-layered coated transparent substrate

A substrate coated on one of its faces with a stack of thin layers having reflection properties in the infrared and/or in solar radiation, including two metallic functional layers, in particular on the basis of silver. Each of the metallic functional layers is disposed between two dielectric coatings. The coating includes at least two absorbent layers which absorb solar radiation in the visible part of the spectrum, which is disposed at least in two different dielectric coatings.

Substrate provided with a stack having thermal properties and an absorbent layer

A material includes a transparent substrate on which is deposited a stack of layers including n silver-based metal functional layers and n+1 dielectric sets of layers, with n&#x2265;3 and each silver-based metal functional layer being placed between two dielectric sets of layers. The dielectric set of layers located below the first silver-based metal functional layer starting from the substrate and the dielectric set of layers located above the last silver-based metal functional layer starting from the substrate each include a high-refractive-index layer, the value of the index&#x2265;2.15 at the wavelength of 550 nm; the value of the refractive index of at least one of the high-index layers&#x2265;2.40 at the wavelength 550 nm; and the value of the ratio of the optical thickness of each of the high-refractive-index layers to the optical thickness of the dielectric set of layers in which it is included is included between 0.25 and 0.55.

Material comprising a stack with thermal properties

A material includes a transparent substrate coated with a stack of thin layers including an alternation of three functional silver-based metallic layers. This material makes it possible to obtain a multiple glazing having good thermal performance results, in particular a selectivity greater than 2, excellent color neutrality and low optical sensitivity.

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Paris, France

Julien Beutier