Agilent Technologies, Inc.

Julie L Stahmer

Cherif Ahrikencheikh

Brent W Thordarson

Jonathan Ernest Buczkowski

David Lawrence Dummer

A fixture assembly is presented. The fixture assembly includes a device assembly for mating with a device under test and a tester interface assembly for mating with the device assembly on one side and a tester on a second side. In the method and apparatus of the present invention, the device assembly includes a probe field specific to a device under test and may be changed to accommodate a different device, without changing the tester interface assembly. The tester interface assembly includes a frame used for alignment and structural support. The frame interfaces with a probe plate on one side and a load plate on the other side. The probe plate holds a plurality of probes in place while the load plate provides a plurality of holes for the probes to extend downward through the load plate. A printed circuit board (PCB) is positioned below the load plate and makes contact with the ends of the probes. The entire tester interface assembly is positioned on top of an electronic tester and maps points of contact in the tester with the probe field of the device assembly.

Adapter method and apparatus for interfacing a tester with a device under test

The present invention is directed to a method and apparatus for balancing forces in a fixture and reducing forces in a probe plate ( ) housed in the fixture. A plurality of double-ended probes ( ) are positioned in the probe plate ( ). A first bit ( ), located at one of the double-ended probe ( ) is in contact with a board under test ( ). A second bit ( ), which is oppositely disposed and located on the other end of the double-ended probe ( ) is in contact with a wireless PCB ( ). A spring ( ) runs the length of the double-ended probe ( ) and is in contact with the first bit ( ) and the second bit ( ).

Growing community of inventors

Fort Collins, CO, United States of America

Julie L Stahmer