Palo Alto Research Center Inc.

Xerox Corporation

Julie A Bert

Eugene Michael Chow

Sourobh Raychaudhuri

Jengping Lu

Lara S Crawford

David Kalman Biegelsen

Robert Anthony Street

Armin R Volkel

Anne Plochowietz

John Christopher Knights

Bradley Rupp

Matthew Adam Shreve

George Amos Gibson

Jeng Ping Lu

Saigopal Nelaturi

Ion Matei

Yunda Wang

Jamie Kalb

Sergey Butylkov

Christopher L Chua

Steven Neltner

Victor Kai Liu

Bernard D Casse

Scott J Limb

Eric Cocker

Norine E Chang

Emily Coker

John C Knights

Disclosed herein are techniques for transferring particles in a pattern. In one implementation, a particle-transferring system includes a first substrate comprising a first surface configured to support a plurality of particles in a non-uniform pattern, and a particle transfer unit configured to remove the plurality of particles from the first surface in response to the plurality of particles being within a first gap. The system also includes a second substrate configured to remove the plurality of particles from the particle transfer unit and secure the plurality of particles to the second surface in response to the plurality of particles being within a second gap. The particle transfer unit is configured to transfer the plurality of particles and maintain the non-uniform pattern regardless of the positions of the plurality of particles, which are not predefined to fit features of the particle transfer unit.

High registration particles-transferring system

An apparatus comprises a frangible structure coupled or integral to at least a portion of the apparatus and a triggerable mechanism disposed at or proximate the frangible structure. The triggerable mechanism is configured to break the frangible structure in response to a trigger signal. A containment structure is disposed on or over at least a portion of the frangible structure. The containment structure is configured to allow at least the portion of the frangible structure to deform or change shape in response to breaking of the frangible structure while keeping substantially all fragments of at least the portion of the broken frangible structure together.

Triggerable mechanisms and fragment containment arrangements for self-destructing frangible structures and sealed vessels

An apparatus includes a structure comprising a predetermined breakable region and a mechanical actuator disposed at or proximate the predetermined breakable region. The mechanical actuator comprises an impact member coupled to a spring arrangement, and a restraint member operably coupled to the spring arrangement. A trigger source is operably coupled to an electrical power source. The trigger source, in response to receiving current from the electrical power source, is configured to release or break the restraint member so as to allow the spring arrangement to forcibly move the impact member into contact with, and break, the predetermined breakable region.

Mechanical triggers and triggering methods for self-destructing frangible structures and sealed vessels

Disclosed are methods and systems of controlling the placement of micro-objects on the surface of a micro-assembler. Control patterns may be used to cause electrodes of the micro-assembler to generate dielectrophoretic (DEP) and electrophoretic (EP) forces which may be used to manipulate, move, position, or orient one or more micro-objects on the surface of the micro-assembler. The control patterns may be part of a library of control patterns.

Method of controlling the placement of micro-objects on a micro-assembler

The system and method described allow for real-time control over positioning of a micro-object. A movement of at least one micro-object suspended in a medium can be induced by a generation of one or more forces by electrodes proximate to the micro-object. Prior to inducing the movement, a simulation is used to develop a model describing a parameter of an interaction between each of the electrodes and the micro-object. A function describing the forces generated by an electrode and an extent of the movement induced due to the forces is generated using the model. The function is used to design closed loop policy control scheme for moving the micro-object towards a desired position. The position of the micro-object is tracked and taken into account when generating voltage patterns in the scheme.

System and method for voltage-based real-time micro-object position control with the aid of a digital computer

Disclosed herein are implementations of a particles-transferring system, particle transferring unit, and method of transferring particles in a pattern. In one implementation, a particles-transferring system includes a first substrate including a first surface to support particles in a pattern, particle transferring unit including an outer surface to be offset from the first surface by a first gap, and second substrate including a second surface to be offset from the outer surface by a second gap. The particle transferring unit removes the particles from the first surface in response to the particles being within the first gap, secures the particles in the pattern to the outer surface, and transports the particles in the pattern. The second substrate removes the particles in the pattern from the particle transferring unit in response to the particles being within the second gap. The particles are to be secured in the pattern to the second surface.

Apparatus for controlling the placement of micro-objects on a micro-assembler

The following relates generally to a magnetic imaging sensor configured to capture vector magnetometry data. One disclosed aspect involves: using a green pumping laser to excite nitrogen vacancy (NV) centers of a diamond crystal; and, through a filter stacked between the diamond crystal and a pixilated image sensor, passing red light caused by the excitation to the pixilated image sensor.

Compact diamond NV center imager

Disclosed are methods and systems of controlling the placement of micro-objects on the surface of a micro-assembler. Control patterns may be used to cause phototransistors or electrodes of the micro-assembler to generate dielectrophoretic (DEP) and electrophoretic (EP) forces which may be used to manipulate, move, position, or orient one or more micro-objects on the surface of the micro-assembler.

Method of controlling placement of micro-objects

The system and method described allow for real-time control over positioning of a micro-object. A movement of at least one micro-object suspended in a medium can be induced by a generation of one or more forces by electrodes proximate to the micro-object. Prior to inducing the movement, a simulation is used to develop a model describing a parameter of an interaction between each of the electrodes and the micro-object. A function describing the forces generated by an electrode and an extent of the movement induced due to the forces is generated using the model. The function is used to design closed loop policy control scheme for moving the micro-object towards a desired position. The position of the micro-object is tracked and taken into account when generating control signals in the scheme.

System and method for capacitance-based real-time micro-object position control with the aid of a digital computer

Various designs are provided to mitigate or solve limitation on the bendability of an active matrix backplanes: including breaking large rigid silicon chips (ICs) into smaller rigid ICs, changing the orientation of rigid ICs, changing the placement of the ICs on the array, thinning the ICs to the point where the Si is flexible, and replacing the ICs with high quality TFT processing which can be done on flexible substrates.

Alternative designs for addressing contacts that enhance bend ability of TFT backplanes

Bending a flexible x-ray detector to image a curved structure or object will distort the object appearance when compared to an image captured by a flat/rigid detector. An image distortion of this type can be corrected when the shape (relative bend position) of the x-ray detector is known. Incorporating strain sensors on the flexible x-ray detector makes it possible to record the local bend of the flexible x-ray detector when an image is taken. This shape information can be used to either label or correct for the image distortions created by bending the x-ray detector to assist users more accustomed to viewing images produced by flat/rigid x-ray detectors.

Flexible x-ray sensor with integrated strain sensor

Transitioning conventional x-ray detector materials and structures to bendable or flexible (e.g., plastic) substrates makes them rugged against breakage when dropped but exposes the detectors to damage if bent. Disclosed are bendable digital x-ray detector structures that are rugged with regard to bending as well as dropping. The structures provide strain matching between layers so that a detector backplane is in and/or near the mechanical neutral plane and therefore less susceptible to bending stress.

Growing community of inventors

East Palo Alto, CA, United States of America

Julie A Bert