Ppg Industries Ohio, Inc.

Julian M Galvan-Miyoshi

Darin W Laird

Nicolas Benjamin Duarte

Juan F Choreno

Alejandro Morones Dobarganes

Zachary J Brown

Jose Alberto Olivares Lecona

Stuart Damon Hellring

Michael Andrew Zalich

A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or emitted by a component including a first pattern, the component including: a substrate; the first pattern disposed over at least a portion of the substrate; an optional primer layer disposed between at least a portion of the substrate and at least a portion of the first pattern; and a first visibly opaque layer including an infrared transparent pigment, the first visibly opaque layer disposed over at least a portion of the first pattern; and comparing the reflectivity and/or absorbance of infrared electromagnetic radiation by the first pattern at one wavelength to the reflectivity and/or absorbance by the primer layer and/or the substrate at the same wavelength.

Method of detecting a concealed pattern

Growing community of inventors

Texcoco, Mexico

Julian M Galvan-Miyoshi