Teraview Limited

Julian Alexander Cluff

Bryan Edward Cole

Donald Dominic Arnone

Michael John Evans

Michael John Withers

Ian V Bradley

Ian Vincent Bradley

An apparatus for investigating a sample comprising: a source of beam radiation; a detector for detecting a beam of radiation reflected by the sample and an optical subsystem for manipulating the beam between source and detector wherein the optical subsystem comprises a first optical element arranged in use to angularly deflect the source beam within a given solid angle and a second optical element arranged to focus the beam from the first optical element onto a substantially flat image plane and wherein radiation reflected by the sample passes back through the first and second optical elements to the detector.

Apparatus and method for investigating a sample

An apparatus for varying the path length of a beam of radiation, the apparatus comprising: an element () rotatably mounted about an axis, said element comprising two reflective surfaces in fixed relation to one another such that radiation may be reflected between said reflective surfaces and out of the element (); and driving means () for rotatably oscillating said element about said axis.

Apparatus for varying the path length of a beam of radiation

An emitter for emitting radiation in a first range of frequencies comprising: a photoconductive material (); and first and second contact elements () separated by a photoconducting gap provided by said photoconducting material (), for applying a bias across said photoconducting gap, wherein at least one of said first and second contact elements () comprises a resistive element () for restricting current flow between said first and second contact elements in a second range of frequencies lower than the first range of frequencies.

Coherent THz emitter with DC power reducing resistor

An apparatus for investigating a sample comprising a source of a beam of radiation, a detector for detecting a beam of radiation reflected by or transmitted through a sample to be imaged, an optical subsystem for manipulating the beam between the source and detector and means for translating the optical subsystem along a first translation axis relative to the source and detector to scan the beam across the sample, wherein the source and the detector are on opposite sides of the subsystem and the beam from the source and the beam reflected or transmitted each enter and exit the subsystem in a direction parallel to the first direction of translation. The apparatus is also suitable for maintaining the relative phase of two beams of radiation, during translation of an optical subsystem.

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Cambridge, United Kingdom

Julian Alexander Cluff