Horiba, Ltd.

Other

Nippon Soken, Inc.

Hideo Ando

Project Kbf Co., Ltd.

Ukon Craft Science Ltd.

Horiba, Ltd.g

Juichiro Ukon

Yoshiaki Togawa

Tetsuji Yamaguchi

Itsuhei Ogata

Atsuhiro Sumiya

Issei Yokoyama

Toshikazu Ohnishi

Toshiaki Iwai

Masaru Inoue

Izumi Nishidate

Takuya Ido

Yasushi Nakata

Akihiro Hirano

Takashi Hagiwara

Susumu Mimura

Tsukasa Satake

Toru Obata

Hiroyuki Kitamura

Kazuyuki Ikemoto

Toshiyuki Tsujimoto

Takeshi Uemura

Yasuhiro Nishikata

Toshihide Sakai

Provided is a reliable or accurate optical detection method or such an optical imaging method. Also provided is an application technique using such a method. At least a part of an optical path starting from a light-emitting source or reaching a photodetector includes a plurality of optical paths. At a predetermined position of the optical path, beams of light after passing through the plurality of optical paths are mixed. This mixed light is used for optical detection or optical imaging. An optical-length difference among beams of light passing through the plurality of optical paths may be longer than the coherence length. Means for feed-backing predetermined characteristics of a target to the optical characteristics to be used for optical detection or optical imaging may be included. Such means may be used separately from the above. Such means may be applied to another technique, an application material or an application program.

Light-source unit, measurement apparatus, near-infrared microscopic apparatus, optical detection method, imaging method, calculation method, functional bio-related substance, state management method, and manufacturing method

Provided is a gel particle measuring apparatus for detecting scattered light generated by light irradiation at a production start time point of a gel particle, and performing measurement promptly and accurately while suppressing attenuation of the scattered light in a solvent in which the phenomenon occurs. The gel particle measuring apparatus includes: a sample cell () configured to accommodate a sample (S) and a solution containing a reagent (R); a stirrer () configured to continuously stir a mixed solution (W) in the sample cell (); a light source () configured to irradiate the mixed solution (W) in the sample cell () with coherent irradiation light (Bm); a backscattered light detector () configured to detect, out of light scattered in the mixed solution (W) in the sample cell (), a backscattered light component returning toward the light source (); a light path adjuster () configured to adjust an incident portion surface of the sample cell () so that a detection light path (ST) of, out of the light scattered in the mixed solution (W) in the sample cell (), light traveling toward the backscattered light detector () is different from a reflection light path (DT) of reflection light (Bm) reflected from a surface of the sample cell (); and a measurement device () configured to determine at least a production start time point of the gel particle (G) in the mixed solution (W) based on a detection output of the backscattered light detector ().

Method and apparatus for measuring gel particle

It is problematic to provide a substrate for surface enhanced Raman scattering spectroscopy capable of being incorporated and used as a detector of a flow system such as a liquid chromatographic device, and a surface enhanced Raman scattering spectroscopy device and a liquid chromatographic device using same. The above problem is solved by providing a substrate body, pores formed penetrating said substrate body, and particles arranged on an exposed surface of said substrate body not to close the pores, and by an analyte being passed through said particles in-between and said pores.

Substrate for surface enhanced Raman scattering spectroscopy and devices using same

Provided is an optical analyzer which can promote enhancement of measurement sensitivity, cost reduction, size reduction, structural flexibility, disturbance resistance, and the like, at the same time. A laser device to be used in such optical analyzer is also provided. An optical analyzer comprises a laser light source (); a wavelength selection element () for selecting and leading out light having a wavelength substantially equal to the absorption wavelength of an analysis object from among light outputted from the laser light source (); an optical detection means () for detecting the intensity of light red out from the wavelength selection element (); and a drive current control means () for increasing or decreasing the drive current of the laser light source () near a specified current value thereof for outputting light of the absorption wavelength, and setting the drive current at such a current value as the intensity of light detected by the optical detection means () has a peak value. The laser light source (), the wavelength selection element (), and the optical detection means () are mounted on a single substrate () which can regulate the temperature to a constant level.

Optical analyzer and wavelength stabilized laser device for analyzer

In situ monitoring of a degradation level of refined oil during use is provided. An excitation light irradiation unit varies intensity of excitation light to irradiate the excitation light onto the refined oil with a resulting fluorescence. A fluorescence intensity detection unit detects the intensity of fluorescence generated by the irradiation of the excitation light, and a time lag characteristic calculation unit calculates a time lag characteristic of a fluorescence intensity variation with respect to the intensity variation of the excitation light. A degradation index value acquisition unit provides to a predetermined correlation between a degradation index value indicating a degradation level of the refined oil and the time lag characteristic is used to acquire a degradation index value from a time lag characteristic calculated in the time lag characteristic calculation unit to determine the current degradation status of the oil.

Refined oil degradation level measuring instrument and refined oil degradation level measuring method

The present invention discloses a system for analyzing elements contained in a sample in very slight amounts, such as C, S, O, N, H and the like in materials, such as steel and ceramics. An element analyzer can gasify the sample elements in an appropriate gas, such as oxygen gas in a high-frequency heating furnace or an electric resistant furnace. Resulting gas can be introduced into a mass spectrometer to permit a quantitative analysis of the sample elements. A metal sample can be levitated and heated and melted with induction current for producing the resultant gas for introduction to a mass spectrometer.

Combustion furnace system for analyzing elements in a sample

An analytical method capable of easily, rapidly, and accurately determining concentrations of a multi-component aqueous solution. Near-infrared spectra of a standard solution containing k components of known concentrations are measured n times within a range of 1,500 to 1,850 nm. A loading matrix of p columns by m rows and an intermediate matrix of k columns by m rows for an appointed factor number m are obtained from a response matrix of p columns by n rows consisting of p absorbance values of the respective spectra in a calibration stage and p absorbance values of a near-infrared spectrum within a wavelength range of 1,500 to 1,850 nm of a test liquid. The test liquid contains k components including pure water of unknown concentrations. The concentrations of the k components are determined from a group of absorbance values and the loading and intermediate matrices obtained in the calibration stage by a matrix operation in an prediction stage. In the calibration stage, k+1 characteristic contents can be obtained by adding a solution temperature as one of characteristic items, and k concentration values and one temperature value can be obtained in the prediction stage.

Analytical method for multi-component aqueous solutions and apparatus

An infrared spectrometer disperses a radiation ray from a catalyst which has been exposed to a gas for evaluation to adsorb adsorbates thereon, and outputs spectral data in accordance with a wavenumber of the radiation ray to a computer storing reference data. The computer normalizes the spectral data and the reference data, and then, it calculates a product of the normalized spectral data and the reference data. Thereafter, a function of the product is differentiated with respect to the wavenumber to obtain a differential function. Accordingly, a specified wavenumber for which the differential function is zero is determined, so that the common peak of the spectral data and the reference data at the specified wavenumber is accurately determined.

Apparatus for determining kinds of adsorbates

A method and apparatus of determining peak positions in a spectrum of data includes providing a spectrum of energy to a sample and measuring the spectrum of energy after contact with the sample to provide a range of spectrum data representative of the sample. The spectrum data is then subjected to a differential calculus operation of an even number to provide a differential spectrum data. The spectrum data and differential spectrum data are combined whereby the characteristics of the components in the sample are enhanced. The combined data is then analyzed so that the components in the sample can be identified.

Method and apparatus for determining a peak position of a spectrum

A wavelength-scanning mechanism for a spectrometer utilizes an eccentric disc cam driven by a pulse motor to pivot a diffraction grating with a contact bar fixed thereto. A light source supplies light to the mechanism with a first concave spherical mirror reflecting light to the diffraction grating and reflecting light reflected by the diffraction grating to a zero-order light detector. A second concave spherical mirror reflects light diffracted by the diffraction grating to a diffracted light detector. A controller receives information from the light detectors and controls the pulse motor. At least one cam follower is mounted on the cam at a position eccentric from the rotational axis thereof and slidably contacts the contact bar. Alternatively, the diffraction grating has two contact bars fixed thereto, and the cam follower is pivoted between the contact bars. A method of utilizing the mechanism first determines a center value of zero-order light reflected by the diffraction grating by pivoting the diffraction grating in steps between the time zero-order light is detected until it is no longer detected. The number of steps is divided by two, which yields the center value. Diffracted light is detected at the center value, and the spectral intensity of the detected diffracted light is calculated.

Wavelength-scanning mechanism and method for spectrometer

An analytical system capable of analyzing data by means of an analytical machine or tool and providing that analytical data to a computer for processing is provided. A protocol conversion radio machine is provided corresponding to each analytical machine and tool to be controlled and data can be communicated in a wireless manner between the analytical machine and tool and a plurality of computers. The protocol conversion radio machines cannot only mutually communicate with the plurality of computers but also can give and receive control signals to assist in the accumulation and transmission of analytical data between the computers and the analytical machines and tools.

Analytical system for remote transmission of data

A particle-size distribution measuring apparatus and method is provided for suspending a sample containing particles in a fluid and introducing the suspended particles into a sample cell. The sample cell is illuminated with light from a laser source and the diffracted light from the particles is measured by an optical detector array. A computer circuit is capable of computing a plurality of graphs of particle-size distribution in repetitive measurement over a predetermined time period. A video display discloses the plurality of graphs in a juxtapositioned arrangement or stacked arrangement to enable the observer to distinguish between any variations in adjacent graphs.

Laser diffraction-type particle size distribution measuring method and

A microscopic spectrometer having a separate optical path for masking light from a sample for spectrometric measurements. In the preferred embodiment, a beam splitter is disposed behind an object lens to form two branched optical paths. One of the optical paths is provided with masks at a point of focus along the path, allowing part of the image to be masked. The second optical path allows optical throughput and observation of the entire image. These two optical paths are rejoined, and a final image is obtained for visual inspection by synthesizing the two optical paths.

Microscopic spectrometer

An infrared microscopic spectrometer includes an optical system which allows for a shifting of the optical path interactive with a sample from a sample transmissive optical path to an optical path through an ATR crystal using ATR analysis. In the shown embodiment, the shift in the optical path is in a direction perpendicular to a transmissive optical axis, at least along a portion of the shift adjacent to the transmissive optical axis. The shift is undertaken by a moving means which moves the collecting element providing the infrared rays. A sample-holding structure allows the ATR crystal to be rotated or detachably removed, as necessary.

Growing community of inventors

Kyoto, Japan

Juichiro Ukon