Siliconware Precision Industries Co., Ltd.

Jui-Yu Chuang

Lien-Chi Chan

Chien-Ping Huang

Chih-Ming Huang

Chi-Chuan Wu

Cheng-Hsu Hsiao

Chien Ping Huang

Ho-Yi Tsai

Ming-Chih Hsieh

Yude Chu

Chi Chuan Wu

Chian Ping Huang

Lien-Chih Chan

A semiconductor package with a lead frame as a chip carrier and a method for fabricating the same are provided. The lead frame includes a die pad and a plurality of leads properly spaced apart from the die pad, each lead being composed of an inner lead portion and an outer lead portion, wherein the inner lead portion is directed toward the die pad, and the outer lead portion has a terminal. At least a chip is mounted on the die pad, and a first encapsulant is formed for encapsulating the chip, die pad and inner lead portions. An injection-molded second encapsulant is formed for encapsulating the first encapsulant and outer lead portions, but exposing the terminals of the outer lead portions. The second encapsulant made by injection molding can prevent resin flash over the exposed terminals, thereby assuring electrical-connection quality of the semiconductor package.

Semiconductor package with lead frame as chip carrier and method for fabricating the same

IC card type circuit module

A heat sink with a collapse structure and a semiconductor device with the heat sink are proposed, in which the heat sink is in ladder-like shape due to a height difference formed between an extending portion and an body of the heat sink, and the body has at least one surface exposed to outside of the semiconductor package. The extending portion produces collapse deformation in response to stress from engagement of molds in a molding process, so as to prevent a semiconductor chip from being damaged by the stress. The heat sink directly attached to the chip allows heat generated by the chip to pass through the extending portion to the body of the heat sink, and then the heat can be dissipated through the exposed surface of the body to the outside of the semiconductor package, so as to improve the heat dissipating efficiency.

Heat sink with collapse structure for semiconductor package

A window-type ball grid array (WBGA) semiconductor package with a lead frame as a chip carrier and a method for fabricating the same are provided. The lead frame has a plurality of leads encompassing an opening, each lead having an upper surface and an opposing lower surface. A resin material is pre-molded on the lower surfaces of the leads, with wire-bonding portions and ball-implanting portions defined on the leads being exposed. At least a chip is mounted on the upper surfaces of the leads and covers the opening, allowing the chip to be electrically connected to the wire-bonding portions of the leads by a plurality of bonding wires via the opening. Then, an encapsulant is formed to encapsulate the chip and fill into the opening for encapsulating the bonding wires. Finally, solder balls are implanted on the ball-implanting portions of the leads to complete fabrication of the semiconductor package.

Window-type ball grid array semiconductor package with lead frame as chip carrier and method for fabricating the same

A semiconductor package and its fabricating method are proposed, in which a plurality of passive devices are integrated under a semiconductor chip, so as to increase the layout number of the passive devices in the semiconductor package and enhance the flexibility of substrate routability, as well as reduce an occupied area of a substrate for miniaturize the semiconductor package in profile. Moreover, as the integrated passive devices are further encapsulated by using an insulative material prior to a molding process, the dislocation of the passive devices caused by a high temperature and mold flow of a molding resin can be prevented from occurrence during molding. Furthermore, the encapsulated passive devices are prevented from contacting bonding wires, allowing the occurrence of short circuit to be avoided and quality of the packaged product to be assured.

Semiconductor package having vertically mounted passive devices under a chip and a fabricating method thereof

Heat sink with collapse structure and semiconductor package with heat sink

A semiconductor device package structure is proposed, which allows the encapsulation body to be highly secured in position to the leads, making the encapsulation body hardly delaminated from the leads. The proposed semiconductor device package structure comprises a die pad; a semiconductor chip mounted on the die pad; a plurality of leads arranged around the die pad, each lead being formed with a bolting hole; a plurality of bonding wires for electrically coupling the semiconductor chip to the leads; and an encapsulation body which encapsulates the semiconductor chip and the bonding wires and includes a part filled in the bolting hole in each of the leads. The bolting hole is characterized in the forming of a constricted middle part or an inclined orientation with respect to the lead surface, which allows the encapsulation body to be highly secured in position to the leads, thereby making the encapsulation body hardly delaminated from the leads. As a result, the finished package product can be highly assured in quality and reliability.

Semiconductor device package structure

A semiconductor package with a heat dissipating structure is proposed, in which the heat dissipating structure is precisely positioned on a substrate, in a manner that a plurality of solder balls self-align with ball pads formed on the substrate, and support a heat sink to be positioned above a semiconductor chip mounted on the substrate. This therefore makes the heat sink closely abut a molding cavity of an encapsulating mold in a molding process, and prevents resin flash from occurring on the heat sink, so that a surface of the heat sink can be directly exposed to the atmosphere for improving heat dissipating efficiency. Moreover, the solder balls characterized in softness deform in response to a pressure generated by the encapsulating mold during molding. Therefore, the substrate can be protected from being damaged by the pressure, and thus quality of the semiconductor package can be assured.

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Taichung, Taiwan

Jui-Yu Chuang