Applied Materials, Inc.

Jui-Che Lin

Chao-Hsien Lee

Shauh-Teh Juang

Pengyu Han

Yan-Jhu Chen

Wallace Wang

An electronic device manufacturing system configured to receive, by a processor, input data reflecting a feature related to a manufacturing process of a substrate. The manufacturing system is further configured to generate a characteristic sequence defining a relationship between at least two manufacturing parameters, and determine a relationship between one or more variables related to the feature and the characteristic sequence. The manufacturing system is further configured to determine a weight based on the determined relationship and apply the weight to the feature. The manufacturing system is further configured to train a machine-learning model in view of the weighted feature.

Methods and mechanisms for preventing fluctuation in machine-learning model performance

An electronic device manufacturing system configured to receive, by a processor, input data reflecting a feature related to a manufacturing process of a substrate. The manufacturing system is further configured to train a machine-learning model based on the input data reflecting the feature. The manufacturing system is further configured to modify the machine-learning model in view of the virtual knob for the feature.

Growing community of inventors

Taipei, Taiwan

Jui-Che Lin