Wallac Oy

Juha Karunen

Markku Ojala

Jarmo Nurmi

Jarmo Sakari Korpi

Timo Salminen

Aarne Heinonen

Janne Salonen

Markku Varjonen

Ilari Torsti

Paul White

Instrumentation and a method for efficient and reliable assaying and measuring samples. The teachings include an automated self-contained instrument, wherein the samples are located on wells of sample plates, and the instrument includes a plurality of units for processing or storing sample plates. The instrument may includes at least one dispensing unit for dispensing reagents or other assay components to the sample wells, at least two units for simultaneously processing or storing a plurality of sample plates, at least one unit for removing substance from the sample wells, and one or several measurement units for optically measuring samples in at least two measurement modes. Further, the instrument includes a manipulator for moving the sample plates in three orthogonal directions or combinations thereof and for rotating the sample plates in relation to a vertical axis for transferring the sample plates to the units.

Automated instrumentation and method for measurements of samples

The invention applies to the binning procedure of data, which is measured with a CCD (Charge-Coupled Device) sensor unit. There is created a solution for measurement of radiation, in which a good signal-to-noise value is achieved, and still it is possible to exploit standard CCD units. This is achieved by selecting the binning areas on the basis of position of defected pixels () in a CCD unit (). One idea is to determine the locations of the defected pixels and to use this information for determining pixel groups that form the super pixels. In a preferable embodiment super pixels (A&#x2013;A, B&#x2013;B, C&#x2013;C, D&#x2013;D, E&#x2013;E) are first determined using a selected binning factor, and those super pixels that would be affected by defected pixels are then reduced into one or more smaller super pixels (B&#x2013;E, B&#x2013;E, C&#x2013;E), which are not affected by the defects.

Method and arrangement for processing measurement data

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Littoinen, Finland

Juha Karunen