Senfit Oy

Juha Heikkinen

Pekka Jakkula

Mikko Vuolteenaho

Taavi Hirvonen

Jarmo Karhu

Matti Limingoja

Taisto Soikkeli

Olavi Hyry

An apparatus for measuring a surface comprises first sensors, which are distributed two-dimensionally in space, said first sensors interacting with the surface in a contactless manner using a microwave range of electromagnetic signals, and the first sensors receive at least two of the microwave signals of the interaction with information relating to distances between the sensors and the surface as a reflection, the microwave signals of the interaction representing both dimensions of the space of two-dimensional distribution of the first sensors. A data processing unit receives said information on the distances, and determines at least one geometrical parameter of the surface on the basis of the information.

Apparatus for and method of measuring surface

An object to be measured is measured using microwave radiation. Oscillation energy is generated by means of a feedback coupled active unit. The solution involves generating resonance into at least one oscillator, each oscillator comprising at least one open resonator, each resonator being coupled to at least one active unit, by using the object to be measured as a functional part of the resonator, the object to be measured causing a resonance frequency dependent on the location of a surface of the object to be measured to be generated in each oscillator. A measurement part determines at least one characteristic of the object to be measured on the basis of the resonance frequency of each oscillator.

Method for microwave measurement, measuring device and oscillator

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Temmes, Finland

Juha Heikkinen