Leica Microsystems Cms Gmbh

Juergen Schneider

Bernd Widzgowski

Roland Seifert

Lars Friedrich

Wernher Fouquet

Arnold Giske

Lioba Kuschel

Jochen Sieber

The invention relates to a method for investigating a sample with regard to the lifetime of an excited state, in particular a fluorescence lifetime, and/or with regard to a property of a sample which is correlated with a lifetime of an excited state, in particular with a fluorescence lifetime, a sample region being illuminated with a sequence of excitation light pulses. The method is characterized in that the light quantity and/or number of photons of the detected light, in particular fluorescent light, proceeding from the sample region is measured temporally between the excitation light pulses exclusively within a detection time window in each case, at least two detection time windows having different temporal lengths.

Method and apparatus for investigating a sample with regard to the lifetime of an excited state

An electronic circuit for protecting a photomultiplier against overloads is provided. The photomultiplier has a cathode, an anode, a plurality of dynodes and a voltage divider. The circuit includes a high-voltage source, which applies a high voltage to the photomultiplier. A protective switch is set up for preventing a current flow through the anode. A comparison device is configured for comparing a load signal characterizing the loading of the anode with a maximum load signal and for driving the protective switch in accordance with this comparison.

Protective circuitry for photomultiplier tubes

A photomultiplier system includes a detector tube, a power supply unit, and a thermal isolation element. The power supply unit provides an accelerating voltage for operating the detector tube. The detector tube and the power supply unit are disposed on different sides of the thermal isolation element.

Photomultiplier system and a microscope

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Sinsheim, Germany

Juergen Schneider