Leica Microsystems Cms Gmbh

Juergen Riedmann

Volker Leimbach

Werner Knebel

Holger Birk

Heinrich Ulrich

Ingo Boehm

Lioba Kuschel

A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.

Device for examining and manipulating microscopic objects with coupled illumination and manipulation light beams

An apparatus for setting a divergence and/or convergence of a light beam includes at least one optical component for influencing the divergence and/or convergence of the light beam. A positioning device is provided for positioning the optical component. The positioning device includes at least one piezoelectric element.

Device for setting the divergence and/or convergence of a light beam

An optical arrangement includes a laser, and a chromatic error correcting device arranged in a beam path of the laser. The chromatic error correcting device includes a pulse stretcher.

Optical arrangement

A method for recognizing dark states during the spectroscopic or microscopic examination of fluorescent specimens includes varying an intensity distribution of excitation light by varying an excitation/illumination volume over a plurality of mutually independent measurements. A determination is made as to whether observed time constants change between the measurements. The existence of a dark state is inferred where the observed time constants are unchanged between the measurements.

Method and device for recognizing dark states during the spectroscopic or microscopic examination of fluorescent specimens

An optical arrangement for a microscope, in particular for a scanning microscope, with a beam splitterarranged in a divergent and/or convergent beam path for separating an illumination lightthat is produced by an illumination source from a detection lightthat is emitted by a sample being tested, which with regard to reliable correction of imaging errors can be implemented and developed even when using thick beam splitterssuch that the beam splitteris wedge-shaped and implemented as a beam splitter plate for reflection primarily at a glass-air interface. Furthermore, a microscope with such an optical arrangement is disclosed.

Growing community of inventors

Obersulm-Eschenau, Germany

Juergen Riedmann