International Business Machines Corporation

Inetrnational Business Machines Corporation

Juergen Koehl

Jason D Hibbeler

Markus Buehler

Jeanne P Bickford

Matthias Ringe

Philipp Panitz

Edward J Nowak

Brent A Anderson

John Maxwell Cohn

Jens Leenstra

Sebastian Ehrenreich

Bernhard Korte

Hans Schlenker

Jens Vygen

Peter Anton Habitz

Juergen Pille

Gustavo Enrique Tellez

Scott Whitney Gould

Paul Steven Zuchowski

Robert J Allen

Joachim Keinert

Daniel Nelson Maynard

Thomas Ludwig

Ivan L Wemple

Andreas Arp

Norbert Schumacher

William John Livingstone

Guenther Hutzl

Jeanne Paulette Spence Bickford

Stephan Held

Jens Massberg

David James Hathaway

Dieter F Wendel

Cyriel Johan Minkenberg

Erich Klink

Ronald Pete Luijten

Asmus Hetzel

Joerg H Walter

Niels Fricke

Parsotam Trikam Patel

Ronald Peter Luijten

Bernd Leppla

Alexander Albert Woerner

Volker Urban

Philip S Honsinger

Juergen Saalmueller

Philipp Salz

Markus Olbrich

Karsten Muuss

Walter Pietschmann

Bernd Kemmler

Uwe Fassnacht

Ankit Gangwar

Arun K Mishra

Daniel Nelson Mayuard

Urich Kranch

Juerge Pilk

Helmut Zudrell

Ulrich Brenner

Andre Rohe

A processor instruction scheduler comprising an optimization engine which uses an optimization model for a processor architecture with: means to generate an optimization model for the optimization engine from a design of a processor and data representing optimization goals and constraints and a code stream, wherein the processor has at least two execution pipes and at least two registers, and wherein the code stream comprises processor instructions with corresponding register selections; and reordering means to generate an optimized code stream from the code stream with the optimal solution provided by the optimization engine for the optimization model by reordering the code stream, such that optimum values for the optimization goals under the given constraints are achieved without affecting the operation results of the code stream.

Instruction scheduling approach to improve processor performance

A processor instruction scheduler comprising an optimization engine which uses an optimization model for a processor architecture with: means to generate an optimization model for the optimization engine from a design of a processor and data representing optimization goals and constraints and a code stream, wherein the processor has at least two execution pipes and at least two registers, and wherein the design comprises data for processor instruction latency and execution pipes, and wherein the code stream comprises processor instructions with corresponding register selections; and reordering means to generate an optimized code stream from the code stream with the optimal solution provided by the optimization engine for the optimization model by reordering the code stream, such that optimum values for the optimization goals under the given constraints are achieved without affecting the operation results of the code stream.

Fixed outline shaped and modifiable outline shaped random logic macros of an electronic circuit design are manipulated by modifying an outline of a modifiable outline shape macro based on criteria consisting of any one of a macro port weight value, a macro port ordering; a macro rapport constraint or a macro logic depth and placing resulting macros at locations on an integrated circuit (chip).

Circuit macro placement using macro aspect ratio based on ports

A method to optimize performance of an electric circuit design is disclosed. The method comprises providing for each circuit element of the electric circuit design available design parameter options; transforming the electric circuit design and the design parameter options into a linear programming model; determining a solution for the linear programming model; and based on the solution generating a list of circuit elements which design parameters need to be changed to a different option to achieve performance optimization.

Method and data processing system to optimize performance of an electric circuit design, data processing program and computer program product

A signal repowering chip comprises an input; at least one inverter connected in series to the input; and at least one switch connected to a test enable signal, the at least one switch configured to allow a signal connected to the input to propagate through the at least one inverter in the event that the test enable signal is on. A 3-dimensional integrated circuit comprises a first chip, the first chip comprising a default voltage level and a plurality of wiring layers; and a second chip, the second chip comprising at least one repeater, the repeater being connected to the default voltage level.

Signal repowering chip for 3-dimensional integrated circuit

A method of estimating integrated circuit yield comprises providing an integrated circuit layout and a set of systematic defects based on a manufacturing process. Next, the method represents a systematic defect by modifying structures in the integrated circuit layout to create modified structures. More specifically, for short-circuit-causing defects, the method pre-expands the structures when the structures comprise a higher systematic defect sensitivity level, and pre-shrinks the structures when the structures comprise a lower systematic defect sensitivity level. Following this, a critical area analysis is performed on the integrated circuit layout using the modified structures, wherein dot-throwing, geometric expansion, or Voronoi diagrams are used. The method then computes a fault density value, random defects and systematic defects are computed. The fault density value is subsequently compared to a predetermined value, wherein the predetermined value is determined using test structures and/or yield data from a target manufacturing process.

Method for computing the sensitivity of a VLSI design to both random and systematic defects using a critical area analysis tool

An integrated circuit including a first wire of a first level of wiring tracks, a second wire of a second level of wiring tracks, a third wire of a third level of wiring tracks, and a fourth wire located at a first distance from the second wire in the second level of wiring tracks. A first via connects the first and second wires at a first location of the second wire. A second via connects the second and third wires at the first location, the second via is approximately axially aligned with the first via. A third via connecting the third and fourth wires at a second location of the fourth wire. A fourth via connecting the first and fourth wires at the second location, the fourth via is approximately axially aligned with the third via. The second, third, and fourth vias, and the third and fourth wires form a path between the first and second wires redundant to the first via.

Redundant micro-loop structure for use in an integrated circuit physical design process and method of forming the same

A method, apparatus, system, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for undesired opens.

Apparatus and computer program product for semiconductor yield estimation

The present invention relates to a method for validating the correct logical function and timing behavior of a digital circuit design within a cycle-based verification environment. The method comprises the steps of providing a VHDL description of the digital circuit design, performing a logic synthesis, wherein the VHDL description is turned into a design implementation in terms of logic gates, and creating a netlist including the elements of the digital circuit design and the connections between said elements. The method comprises the further steps of providing a transformation script with at least one transparent storage element, wherein said transparent storage element represents a path delay within the digital circuit design, creating a new netlist with the at least one transparent storage elements, running a verification, and checking if the new netlist is clean from a logical and timing point of view.

Method for validating logical function and timing behavior of a digital circuit decision

The invention relates to a delay calculation method for wiring nets of an electronic circuit, wherein a net within an electronic circuit comprises a driver pin and a receiving pin being coupled by at least one loop, the loop comprising a first branching path and a second branching path electrically parallel to the first branching path, wherein at least a first and a second branching point connect the branching paths. The method comprises the steps of disconnecting each branching path once at a time at a specific point in said the at least one loop which connects a driver to at least one specific receiving pin; calculating a delay value of a signal connection between the driver pin and each of the receiving pin for each of the disconnected branching paths of each loop; storing maximum and/or minimum calculated delay values; and applying at least one of the delay values for static timing analysis of the electronic circuit.

Routing of wires of an electronic circuit

The invention relates to a method and a system for placing electric circuits in integrated circuit chip design. Specifically, the invention encompasses performing a global placement step placing the cells into bins on the chip, as well as a detailed placement process which arranges the cells in the bins to obtain a legal arrangement while generating simply connected free space for routing channels.

Method and system for placement of electric circuit components in integrated circuit design

Disclosed is a method that predicts test yield for a semiconductor product, prior to design layout. This is accomplished by applying a critical area analysis to individual library elements that are used to form a specific product and by estimating the test yield impact of combining these library elements. For example, the method considers the test yield impact of sensitivity to library element to library element shorts and the test yield impact of sensitivity to wiring faults. The disclosed method further allows die size growth to be traded off against the use of library elements with higher test yield in order to provide an optimal design solution. Thus, the method may be used to modify library element selection so as to optimize test yield. Lastly, the method further repeats itself at key design checkpoints to revalidate initial test yield (and cost) assumptions made when the product was quoted to a customer. Thus, the method provides increased accuracy of test yield estimate from initial sizing through design and further allows designs to be modified to improve test yield.

Test yield estimate for semiconductor products created from a library

A computer readable medium, system and associated method is provided for designing an integrated circuit with inserted loops. The method comprises the steps of inserting a loop with tagged wire segments and/or vias in a fully routed and DCR clean integrated circuit; performing a DRC; and fixing DRC violations by removing tagged wire segments and/or vias which contribute to a violation.

Computer readable medium, system and associated method for designing integrated circuits with loop insertions

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Weil im Schoenbuch, Germany

Juergen Koehl