Leica Microsystems Heidelberg Gmbh

Leica Microsystems Cms Gmbh

Juergen Hoffmann

Johann Engelhardt

Werner Knebel

Heinrich Ulrich

Hilmar Gugel

William C Hay

Joerg Bewersdorf

Holger Birk

Rafael Storz

Kyra Moellmann

Jörg Bewersdorf

A microscope with a first and a second illumination light beam for illuminating a sample, wherein the first and/or the second illumination light beam evanescently illuminates the sample. For the purpose of CARS testing, the first illumination light beam can be a pump light beam, and the second illumination light beam can be a Stokes light beam. To increase resolution, the first illumination light beam can be an excitation light beam, and the second illumination light beam can be a stimulation light beam.

Microscope with evanescent wave illumination

The present invention concerns a double confocal scanning microscope () having an illuminating beam path () of at least one light source (), and a detected beam path () of at least one detector (), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components () arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis () and/or at least one surface () in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.

Double confocal scanning microscope

The scanning microscope includes an illumination beam path, microscope optics and at least one light source which generates an excitation light beam of a first wavelength and a second light beam of a second wavelength. Microscope optics are provided for focussing the excitation light beam onto a first focal region in a first plane of a sample and for focusing the second light beam onto a second focal region in a second plane of the sample. The first focal region and the second focal region overlap partially. The optical properties of the components arranged in the illumination beam path are matched to one another such that optical aberrations are corrected in such a way that the focal regions remain static relative to one another irrespective of the scanning movement.

Scanning microscope

A method for examining a specimen () that exhibits at least two optical transition lines and is optically excitable at least with light of a first and light of a second wavelength is characterized by the step of illuminating the specimen () with illuminating light () that generates at least a multiple of the first wavelength and a multiple of the second wavelength; and by the step of detecting the detected light () proceeding from the specimen (). Also disclosed is a scanning microscope system () having at least one light source () that emits illuminating light () for illumination of a specimen (), the specimen () exhibiting at least two optical transition lines and being optically excitable at least with light of a first and light of a second wavelength, having at least one detector () for detection of the detected light () proceeding from the specimen () and an objective () for focusing the illuminating light () onto a subregion of the specimen (). The scanning microscope system is characterized in that the illuminating light () generates at least a multiple of the first wavelength and a multiple of the second wavelength.

Method for examining a specimen, and scanning microscope system

A method for scanning microscopy is disclosed. It contains the step of generating an illuminating light beam that exhibits at least a first substantially continuous wavelength spectrum whose spectral width is greater than 5 nm; the choosing of a second wavelength spectrum that is arranged spectrally within the first wavelength spectrum; the step of selecting the light of the second wavelength spectrum out of the illuminating light beam using an acoustooptical component; and the step of illuminating a specimen with the illuminating light beam. A scanning microscope is also disclosed.

Method for scanning microscopy; and scanning microscope

The invention discloses a scanning microscope for optical measurement with high spatial resolution of a specimen point of a specimen, having a light source for emitting an exciting light beam suitable for exciting an energy state of the specimen; a detector for detection of the emitted light; and a stimulating light beam, coming from the light source, for generating stimulated emission of the specimen excited by the exciting light beam at the specimen point, the exciting light beam and the stimulating light beam being arranged in such a way that their intensity distributions in the focal region partially overlap, wherein optical elements which shape the stimulating light beam are combined into at least one module that is positionable in the beam path of the scanning microscope.

Scanning microscope with a detector and light source for exciting an energy state in a specimen and module for a scanning microscope

The scanning microscope comprises an illumination beam path (), microscope optics () and at least one light source (), which generates an excitation light beam () of a first wavelength and an emission light beam () of a second wavelength. The first focal region and the second focal region overlap partially. The optical properties of the components arranged in the illumination beam path () are matched to one another such that optical aberrations are corrected in such a way that the focal regions remain static relative to one another irrespective of the scanning movement.

An optical arrangement, in particular a microscope, having a light source () for illuminating an object, and a glass fiber (), arranged between the light source () and the object, for transporting light along a prescribable distance between the light source () and the object, is configured with regard to the avoidance of fluctuations in the illuminating light power without a handicap in the optical adjustment of the arrangement in such a way that the glass fiber () is a polarizing glass fiber ().

Optical arrangement and microscope

A light source for illumination in scanning microscopy, and a scanning microscope contain an electromagnetic energy source that emits light of one wavelength, and a beam splitter for spatially dividing the light into at least two partial light beams. An intermediate element for wavelength modification is provided in at least one partial light beam.

Light source for illumination in scanning microscopy, and scanning microscope

The invention discloses a fluorescence microscope comprising a light source that emits excitation light for illumination of a specimen, means for defining a two-dimensional search region for the excitation and detection wavelengths, means for selecting a subregion from the search region, at least one detector that detects detected light proceeding from the specimen, and a display for displaying an image of at least a portion of the specimen. Furthermore the invention discloses a method for fluorescence microscopy.

Method for fluorescence microscopy, and fluorescence microscope

A confocal scanning microscope has an illuminating beam path and at least one light source. The light of the light source is coupled into a fiber in which laser transitions can be induced. At least laser light induced in the fiber serves for specimen illumination after passing through an excitation pinhole.

Optical arrangement for the illumination of specimens for confocal scanning microscopes

An optical arrangement having a light source, preferably a laser, for generating a light beam ( ); at least one acoustooptical deflection device ( ) for the light beam ( ); and a correction device for correcting beam aberrations produced by the deflection device ( ) is configured, in the interest of flexible and reliable correction of aberrations occurring because of the deflection, in such a way that the correction device comprises an adaptive optical system ( ). Also described is a method for the deflection of light beams ( ) with a light source, preferably a laser, for generating a light beam ( ); at least one acoustooptical deflection device ( ) for the light beam ( ); and a correction device for correcting beam aberrations produced by the deflection device ( ), in which an adaptive optical system ( ) is used as the correction device.

Optical arrangement, and method for the deflection of light beams

The present invention concerns an apparatus for combining light from at least two laser light sources, preferably in the context of confocal scanning microscopy, and in order to make laser light sources of low output power usable as light sources, in particular for confocal scanning microscopy, is characterized in that the light from the laser light sources has at least approximately the same wavelength; and that at least one beam combining unit that combines the light beams in at least largely lossless fashion is provided.

Apparatus for combining light and confocal scanning microscope

A method for examining a specimen ( ) by means of a confocal scanning microscope having at least one light source ( ), preferably a laser, to generate an illuminating light beam ( ) for the specimen ( ), and a beam deflection device ( ) to guide the illuminating light beam ( ) over the specimen ( ) comprises the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen ( ) in accordance with the allocation is then accomplished. Lastly, the reflected and/or fluorescent light proceeding from the specimen ( ) is detected.

Method for examining a specimen

An optical arrangement, in particular a laser scanning microscope, having a light source, in particular a laser light source, and an interruption device ( ) for a light beam ( ) of the light source, is configured, in the interest of reliable operation, in such a way that means ( ) for monitoring the functioning of the interruption device ( ) are associated with the interruption device ( ). The invention additionally concerns a shutter ( ) for a light beam ( ) of a light source, in particular a laser light source, which, again in the interest of reliable operation of an optical arrangement, is characterized by at least two movable components ( ) which are configured and arranged such that the mechanical momentum generated by a moving component ( ) or by several moving components is compensated for by the motion of the other component ( ) or components.

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Wiesbaden, Germany

Juergen Hoffmann