Himax Display, Inc.

Ju-Tien Cheng

Cheng-Chi Yen

Wei-Ting Lan

Hon-Yuan Leo

Yih-Long Tseng

A light detecting circuit and a light detecting method thereof are provided. The light detecting circuit includes a first resistor, a light sensor, a current source, and a first current mirror. The light sensor generates a corresponding photocurrent according to the illumination while being illuminated by the high brightness light beam. By dividing the photocurrent corresponding to the low brightness light beam from the photocurrent through the current source, the light detecting circuit can mainly detects the high brightness light beam, so that the detecting accuracy can be enhanced. Accordingly, when being applied to detect the high brightness light beam, the light detecting circuit can provide a sensing voltage in a wide enough range and a large enough sense scale, so that the sensing voltage is easy to be distinguished by the rear stage.

Light sensing circuit having programmable current source and method thereof

A pixel circuitry for a display apparatus is provided herein. The pixel circuitry includes a first storage element, and a switching element composed of a plurality of switches. The first storage element has a first terminal receiving a pixel signal and a second terminal coupled to a first voltage. The first storage element is used for storing the pixel signal. The switching element includes a first switch and a second switch respectively conducted in response to a first signal and a second signal. Each of the first switch and the second switch has an input terminal coupled to a data line and an output terminal coupled to the first storage element. The cooperation of the first switch and the second switch has benefit of delivering the pixel signal without influence of body effect.

Pixel circuitry for display apparatus

A test method of a liquid crystal display panel is provided. The liquid crystal display panel includes a plurality of pixels and a testing pad. The pixels are disposed at intersections between a first, a second, and a third data lines and a plurality of scan lines. In the test method, each of the scan lines is driven to connect liquid crystal capacitors of the pixels to the first, the second, and the third data lines. A first and a second test voltages are respectively supplied to the first and the second data lines, wherein the first test voltage is not equal to the second test voltage. The first data line is floated. The floated first data line is measured through the testing pad to determine whether the liquid crystal capacitors of the pixels electrically connected to the first and the second data lines are electrically connected with each other.

Test method of liquid crystal display panel

A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.

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Tainan County, Taiwan

Ju-Tien Cheng