Vasipari Kutato Intezet

Magyar Tudomanyos Akademia Muszaki Fizikai Kutato Intezete

Jozsef Kiss

Gyorgy Ferenczi

Peter Horvath

Janos Boda

Istvan Tamas

Gyula Kiss

Ferenc Toth

Lajos Tamas

Antal Kaldor

A Deep Level Transient Spectroscopy (DLTS) method in which a high frequency measuring signal is applied continuously on a semiconductor junction, and exciting pulses are generated which are coupled through fast semiconductor switching elements to the junction to alternatively bias the junction in reverse and forward (or slightly reverse) directions. The high frequency measuring signal passed through the junction is evaluated by means of a lock-in amplifier phase-locked with a constant phase angle, independent of the repetition rate of the exciting pulses. The evaluation circuits of the apparatus including the lock-in amplifier are controlled by switching elements driven by control signals generated from the exciting pulses.

Method for deep level transient spectroscopy scanning and apparatus for

A process for reducing the inclusion content of steels and refining their structure which comprises the steps of subjecting molten steel containing inclusions to a pressure of at least 1 atm; removing inclusions from the molten steel by introducing therein at said pressure an inclusion-removing alloy containing calcium or magnesium; and thereafter applying vacuum to the molten steel to evaporate residual calcium or magnesium from the steel.

Process and apparatus for reducing the inclusion content of steels and

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Budapest, Hungary

Jozsef Kiss