Nvidia Corporation

Joyjit Daw

David Nister

Urs A Muller

Bernhard Firner

Rotem Aviv

Zongyi Yang

Jesse Hong

Roberto Giuseppe Luca Valenti

In various examples, sensor data recorded in the real-world may be leveraged to generate transformed, additional, sensor data to test one or more functions of a vehicle—such as a function of an AEB, CMW, LDW, ALC, or ACC system. Sensor data recorded by the sensors may be augmented, transformed, or otherwise updated to represent sensor data corresponding to state information defined by a simulation test profile for testing the vehicle function(s). Once a set of test data has been generated, the test data may be processed by a system of the vehicle to determine the efficacy of the system with respect to any number of test criteria. As a result, a test set including additional or alternative instances of sensor data may be generated from real-world recorded sensor data to test a vehicle in a variety of test scenarios.

Simulating realistic test data from transformed real-world sensor data for autonomous machine

In various examples, sensor data recorded in the real-world may be leveraged to generate transformed, additional, sensor data to test one or more functions of a vehicle—such as a function of an AEB, CMW, LDW, ALC, or ACC system. Sensor data recorded by the sensors may be augmented, transformed, or otherwise updated to represent sensor data corresponding to state information defined by a simulation test profile for testing the vehicle function(s). Once a set of test data has been generated, the test data may be processed by a system of the vehicle to determine the efficacy of the system with respect to any number of test criteria. As a result, a test set including additional or alternative instances of sensor data may be generated from real-world recorded sensor data to test a vehicle in a variety of test scenarios—including those that may be too dangerous to test in the real-world.

Simulating realistic test data from transformed real-world sensor data for autonomous machine applications

Growing community of inventors

New York, NY, United States of America

Joyjit Daw